Self-testing device supporting full card radio-frequency test and using method thereof

Abstract

A self-testing device supporting full card radio-frequency test and a using method thereof relate to the technical field of non-contact IC cards. The self-testing device comprises a full card supporting a self-testing function, a testing bench, and a testing software platform, all of which are connected together in sequence. The full card comprises an antenna network, an NFC chip, and a CPU intelligent card. The self-testing device is structurally characterized in that the NFC chip comprises a receiving unit, a transmitting unit, an antenna unit, a power unit, a phase-locked loop unit, a control unit, a memory cell, an interface unit, and an automatic test assisting unit. The receiving unit, the phase-locked loop unit, the transmitting unit and the antenna unit are connected sequentially into a loop to form a radio frequency unit. The radio frequency unit sends and receives signals according to the ISO 14443/FeliCa protocol standard. The control unit is connected with the receiving unit, the phase-locked loop unit, the transmitting unit, the automatic test assisting unit, the memory cell, the interface unit and the power unit. By adopting the self-testing device, the testing time for in-batch full card testing can be reduced. The self-testing device has characteristics of simple test and low cost.

Description

technical field [0001] The invention relates to the technical field of non-contact IC cards, in particular to a self-test device and a method for using the same in an active non-contact IC card for mobile payment that supports radio frequency testing of all cards. Background technique [0002] With the increasing share of smart phones in the mobile device market, applications based on smart mobile devices have been greatly promoted and developed. In payment applications, transplanting various payment methods such as credit card payment and one-card payment to mobile devices such as mobile phones forms a strong market demand, and accordingly integrates / embeds mobile payment modules into mobile terminal devices to realize mobile payment functions become the mainstream development trend. [0003] Payment methods based on mobile terminal devices such as mobile phones are called mobile payments. Taking a mobile phone as an example, when a mobile phone with a mobile payment ...

AI Technical Summary

Problems solved by technology

The production and packaging process may cause the failure of the whole card function, especially the failure of the whole card RF module due to the weak soldering of the separation components and the problem of wiring.

The full card protocol specification test takes a long time, the test equipment is relatively complicated, and the test cost is high

If the NFC radio frequency module of the whole card to be tested has failed, further protocol specification testing will inevitably cause further waste of test resources, increase test time and test cost

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