A method and device for determining the incident angle of a terahertz wave reflection measurement system

A technology of reflection measurement and determination method, which is applied in the field of terahertz, can solve problems such as easy deviation and poor accuracy of incident angle, and achieve the effect of reducing angle measurement error and improving measurement accuracy

Active Publication Date: 2021-03-16
BEIJING INST OF ENVIRONMENTAL FEATURES
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to solve the problem that the prior art relies on manual reading of the goniometer to obtain the incidence angle accuracy of the terahertz wave reflection measurement, which is prone to deviation.

Method used

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  • A method and device for determining the incident angle of a terahertz wave reflection measurement system
  • A method and device for determining the incident angle of a terahertz wave reflection measurement system
  • A method and device for determining the incident angle of a terahertz wave reflection measurement system

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Embodiment 1

[0047] Such as figure 1 As shown, the first embodiment provides a method for determining the incident angle of a terahertz wave reflection measurement system, including the following steps:

[0048] S1. Terahertz wave transmission measurement Obtain the terahertz wave transmission electric field intensity when the first calibration plate and the second calibration plate are respectively used as the measured sample, and the terahertz wave transmission electric field intensity when there is no measured sample, wherein the second calibration plate Different from the transmittance of the first calibration plate.

[0049] During the terahertz wave transmission measurement, the terahertz wave is incident on the sample to be measured, that is, passes through the sample vertically. The first calibration plate and the second calibration plate are materials that both have the characteristics of transmission and reflection of terahertz waves and have extremely weak absorption of teraher...

Embodiment 2

[0082] An embodiment of the present invention also provides a device for determining the incident angle of a terahertz wave reflection measurement system, including: a first calibration plate, a second calibration plate, a transmission measurement module, a reflection measurement module, and a calculation module, specifically:

[0083] The transmittance of the second calibration plate is different from that of the first calibration plate; the transmission measurement module is used to obtain the terahertz wave transmission electric field intensity and the absence of The terahertz wave transmission electric field intensity when the sample is tested; the reflection measurement module is used to obtain the terahertz wave reflection electric field intensity reflected by the first calibration plate and the second calibration plate at the same incident angle through the terahertz wave reflection measurement; the calculation module It is used to calculate the transmission coefficient ...

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Abstract

The invention relates to a method for determining an incident angle of a terahertz wave reflection measurement system. The method comprises the following steps of: obtaining a first calibration plateand a second calibration plate by a terahertz wave transmission measurement, wherein the first calibration plate is taken as the electric field intensity of the terahertz wave transmission of a sampleto be measured, and the second calibration plate is taken as the electric field intensity of the terahertz wave transmission when no sample is measured, so as to obtain complex refractive indexes ofthe first calibration plate and the second calibration plate; at a certain incident angle, obtaining the electric field intensities of the terahertz wave reflection separately reflected by the first calibration plate and the second calibration plate by a terahertz wave reflection measurement; separately solving reflection coefficient expressions of the two according to the complex refractive indexes of the first calibration plate and the second calibration plate, and the Fresnel formula; and calculating the incident angle of the terahertz wave reflection measurement system by combining the ratio of the electric field intensities of the terahertz wave reflection reflected by the two. The invention further relates to a device for determining the incident angle of the terahertz wave reflection measurement system. According to the method and the device, the problem that an angle measuring instrument in the prior art cannot accurately determine the incident angle is solved by accurately calculating the incident angle of the terahertz wave reflection measurement system.

Description

technical field [0001] The invention relates to the field of terahertz technology, in particular to a method and device for determining the incident angle of a terahertz wave reflection measurement system. Background technique [0002] Terahertz pulses generally refer to electromagnetic waves with wavelengths from 30 micrometers to 3 millimeters and frequencies from 0.1 to 10 terahertz. Terahertz pulses lie between infrared and millimeter waves and have a fairly wide spectrum. Because terahertz pulses are in the transition region between photonics and electronics, it can provide information that traditional detection methods such as visible light or microwaves cannot provide, so it has great application prospects in the fields of physics, chemistry and biomedicine. [0003] At present, the terahertz wave reflection measurement system usually relies on the reading of the external goniometer to obtain the incident angle of the terahertz wave reflection measurement. This metho...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/55G01N21/3586G01N21/3563
CPCG01N21/3563G01N21/3586G01N21/55G01N2021/558
Inventor 孙金海蔡禾郑岩张旭涛张景刘永强巢增明殷红成
Owner BEIJING INST OF ENVIRONMENTAL FEATURES
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