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Method and system for determining intrinsic linear function of Fourier transform spectrometer

A technology of Fourier transform and determination method, which is applied in the field of determination method and system of the inherent linear function of Fourier transform spectrometer, can solve the problems of lack of universality and difficulty in solving analytical expressions, and achieve the effect of improving the level of data application

Active Publication Date: 2021-04-20
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI +1
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Problems solved by technology

[0003] The purpose of the present invention is to provide a method and system for determining the inherent linear function of a Fourier transform spectrometer, which solves the problem that the analytical expression of the inherent linear function of the Fourier transform spectrometer is difficult to solve and does not have universality, and improves the data application of the Fourier transform spectrometer Level

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  • Method and system for determining intrinsic linear function of Fourier transform spectrometer
  • Method and system for determining intrinsic linear function of Fourier transform spectrometer
  • Method and system for determining intrinsic linear function of Fourier transform spectrometer

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Embodiment Construction

[0046] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0047] In order to make the above objects, features and advantages of the present invention more comprehensible, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0048] figure 1 It is a flowchart of a method for determining the intrinsic linear function of a Fourier transform spectrometer according to an embodiment of the present invention. As shown in the figure, a metho...

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Abstract

The invention discloses a method and system for determining the intrinsic linear function of a Fourier transform spectrometer. The method includes: obtaining the relative positional relationship between the optical axis of the Fourier transform spectrometer and the image plane of the detector; taking the closest point of the detector to the optical axis as the starting point, and taking the farthest point of the detector from the optical axis as the end point to determine the circumference The maximum value of the radius and the minimum value of the radius of the circle; according to the maximum value of the radius of the circle, the middle circle is determined; all the middle circles are divided into N sections of arcs with the same arc length; All intersecting points; accumulate all point values ​​to get the accumulated value; determine the proportional value of the arc length corresponding to the current radius according to the accumulated value and the number of divisions; obtain the frequency amplitude according to the proportional value; construct an inherent value based on multiple frequency amplitudes Linear function curve. The method or system of the invention solves the problem of difficulty in solving the analytical expression of the inherent linear function of the Fourier transform spectrometer and lack of universality.

Description

technical field [0001] The invention relates to the field of spectral analysis, in particular to a method and system for determining the inherent linear function of a Fourier transform spectrometer. Background technique [0002] Fourier transform spectroscopy is an important means of spectral analysis. The response of Fourier transform spectrometers to monochromatic light usually has a certain shape, called a linear function. The linearity function is mainly derived from two aspects. The first is the broadening caused by the apodization process, which is called the ideal linearity function; the second is the broadening caused by factors such as finite aperture and optical axis offset, which is called the intrinsic linearity function. Accurate analysis of the measurement spectrum requires an accurate grasp of the ideal linear function and the intrinsic linear function. Among them, the inherent linear function depends on the shape of the detector and its direct relative relat...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/28
CPCG01J3/28
Inventor 吴军崔方晓李大成李扬裕王安静郭腾霄董晓强
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI