Method and system for determining inherent linear function of Fourier transform spectrometer

Abstract

The invention discloses a method and a system for determining the inherent linear function of a Fourier transform spectrometer. The method comprises the following steps: acquiring a relative positionrelationship between an optical axis of the Fourier transform spectrometer and an image plane of a detector; determining a maximum circumference radius and a minimum circumference radius by taking a nearest point of the detector from the optical axis as a starting point and a farthest point of the detector from the optical axis as an end point; determining middle circumferences according to the maximum circumference radius; dividing all the middle circumferences into N segments with the same arc length; obtaining all points intersecting the image plane of the detector according to equivalencepoints of the circular arcs on the circumferences; accumulating all the points to obtain an accumulative value; determining the proportion value of an arc length corresponding to a current radius according to the accumulative value and the number of divisions; obtaining frequency amplitudes according to the proportion value; and constructing an intrinsic linear function curve according to multiplefrequency amplitudes. Through adoption of the method or the system disclosed by the invention, the problem that an analytical expression of the inherent linear function of the Fourier transform spectrometer is difficult to solve and does not have generality is solved.

Description

technical field [0001] The invention relates to the field of spectral analysis, in particular to a method and system for determining the inherent linear function of a Fourier transform spectrometer. Background technique [0002] Fourier transform spectroscopy is an important means of spectral analysis. The response of Fourier transform spectrometers to monochromatic light usually has a certain shape, called a linear function. The linearity function is mainly derived from two aspects. The first is the broadening caused by the apodization process, which is called the ideal linearity function; the second is the broadening caused by factors such as finite aperture and optical axis offset, which is called the intrinsic linearity function. Accurate analysis of the measurement spectrum requires an accurate grasp of the ideal linear function and the intrinsic linear function. Among them, the inherent linear function depends on the shape of the detector and its direct relative relat...

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Problems solved by technology

[0003] The purpose of the present invention is to provide a method and system for determining the inherent linear function of a Fourier transform spectrometer, which solves the problem that the analytical expression of the inherent linear function of the Fourier transform spectrometer is difficult to solve and does not have universality, and improves the data application of the Fourier transform spectrometer Level

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