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Abnormal information monitoring method and device

An abnormal information and abnormal technology, applied in neural learning methods, instruments, biological neural network models, etc., can solve problems such as high false alarm rate and ignoring detailed information, enrich data sources, and improve abnormal monitoring efficiency and accuracy. Effect

Pending Publication Date: 2019-04-05
ADVANCED NEW TECH CO LTD
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In related technologies, the monitoring of business data is mainly focused on the monitoring of single-source time series, and it is carried out on the indicators after aggregation and calculation. The specific detailed information will be ignored, and the structural information in the data will naturally will also be ignored, resulting in a high false positive rate for anomaly detection

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  • Abnormal information monitoring method and device
  • Abnormal information monitoring method and device
  • Abnormal information monitoring method and device

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Embodiment Construction

[0068] One or more embodiments of this specification provide a method and device for monitoring abnormal information, which are used to integrate structural information into the process of monitoring abnormal information, thereby improving the accuracy and efficiency of monitoring abnormal information.

[0069] In order to enable those skilled in the art to better understand the technical solutions in one or more embodiments of this specification, the following will describe the technical solutions in one or more embodiments of this specification in conjunction with the drawings in one or more embodiments of this specification The technical solution is clearly and completely described, and obviously, the described embodiments are only a part of the embodiments in this specification, rather than all the embodiments. Based on one or more embodiments of this specification, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall wi...

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Abstract

One or more embodiments of the invention disclose an abnormal information monitoring method and an abnormal information monitoring device, which are used for integrating structural information into anabnormal information monitoring process so as to improve the accuracy and efficiency of abnormal information monitoring. The method comprises the following steps: obtaining a training sample for training an ANN classifier; Wherein the ANN classifier is used for monitoring a node association event, and the node association event refers to an association relationship among a plurality of nodes; Training the ANN classifier by using the training sample, wherein the ANN classifier comprises information about whether the node association event occurs at each time; Using the ANN classifier to predict whether the node association event occurs at a specified time or not, and obtaining a prediction result; And monitoring the node association event according to the prediction result.

Description

technical field [0001] This specification relates to the technical field of information monitoring, in particular to a method and device for monitoring abnormal information. Background technique [0002] With the rapid development of various businesses, there are hundreds of system platforms supporting the bottom layer at this stage. The weekly code, database and configuration changes of these platforms have reached thousands of data. Any negligence or error in any link , may lead to system risks and bring huge losses to users. [0003] In related technologies, the monitoring of business data is mainly focused on the monitoring of single-source time series, and it is carried out on the indicators after aggregation and calculation. The specific detailed information will be ignored, and the structural information in the data will naturally will also be ignored, resulting in a high false positive rate for anomaly detection. In fact, the intricate call structure between system...

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Application Information

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IPC IPC(8): G06K9/62G06N3/08
CPCG06N3/08G06F18/214G06F18/24
Inventor 周扬
Owner ADVANCED NEW TECH CO LTD