A backplane testing device and method based on atca architecture
A test device and backplane technology, which is applied to measurement devices, electronic circuit testing, automated test systems, etc., can solve the problems of single function and high cost, and achieve the effects of simple equipment investment, improved efficiency, and high test efficiency.
Active Publication Date: 2021-06-15
WUHAN YANGTZE OPTICAL TECH
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Problems solved by technology
[0003] The technical problem to be solved by the present invention is to provide a backplane testing device and method based on the ATCA architecture, with simple investment in equipment, and avoiding the problems of investing in special equipment, high cost and single function for the vacancy of the current backplane testing device. The wiring is convenient, the test efficiency is high, and the test results are true and reliable, which can greatly improve the efficiency of system verification
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[0041] Embodiments of the invention are described in detail below, examples of which are illustrated in the accompanying drawings. The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention.
[0042] An embodiment of the present invention proposes a kind of backplane data path test device based on ATCA architecture, such as figure 2 , 3 , 4, the test device of the embodiment is divided into three kinds, respectively used for testing the business slot of the tested backplane and the Fabric service data port of the uplink slot, the business slot and the Base management data port of the uplink slot channel and the Base management data port channel between the first switch control board and the second switch control board (active and standby switch control boards). The implementation manners are introduced respectively according to the three situations below. ...
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A backplane testing device and method based on ATCA architecture, the device at least includes two switching control boards, an uplink board, a set of test tooling boards, a flow testing instrument and an ATCA chassis, the backplane of the ATCA chassis is set The switch control slot, service slot and uplink slot, the switch control board and the uplink board are respectively inserted into the switch control slot and the uplink slot of the backplane, and a test tooling board is inserted into each service slot. Method Through the corresponding wiring and configuration of the port VLAN of the switch chip on the main control switch board, all the data channels on the entire backboard are looped together, and are led out from the two ports connected to the streaming test instrument, and the two ports are configured. Two ports communicate with each other, pass the traffic through all the data channels on the backplane, quickly check whether there is any problem with the data channel on the backplane through the streaming results, and use the "dichotomy" to quickly locate the problem. The invention has simple equipment investment, convenient wiring, high test efficiency, true and reliable test results, and greatly improves system verification efficiency.
Description
technical field [0001] The invention relates to the field of backplane data channel testing, in particular to a backplane testing device and method based on an ATCA framework. Background technique [0002] The ATCA (Advanced Telecom Computing Architecture) standard is an advanced telecom computing platform, mainly aimed at telecom carrier-level applications, providing a cost-effective, compatible, and scalable hardware architecture for next-generation communications and data network applications. The form of the structure is presented to meet the modern demand for high-speed data transmission, and provides a "reliable, usable, and applicable" solution for the new generation of telecom operation equipment. As an important part of the ATCA architecture, the backplane is especially important to verify its performance. The current testing devices and testing methods are all for single boards, and there is no testing device and method for backplanes, and the traditional testing ...
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IPC IPC(8): G01R31/28
CPCG01R31/282G01R31/2834
Inventor 李绍杰彭有鹏郭雷吕红奎郑直
Owner WUHAN YANGTZE OPTICAL TECH