Waveform testing method of detonation waves

A waveform test and detonation wave technology, applied in the field of wireless high-speed dynamic process test, to achieve the effect of facilitating popularization and application, easy operation and simple operation

Active Publication Date: 2019-07-12
BEIJING INSTITUTE OF TECHNOLOGYGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In view of the above analysis, the present invention aims to provide a detonation wave waveform test method to solve the problem of simultaneously testing and recording the detonation wave waveforms at different positions inside the charge column at the cross-section and at the end face

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Embodiment Construction

[0029] Preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, wherein the accompanying drawings constitute a part of the application and together with the embodiments of the present invention are used to explain the principle of the present invention and are not intended to limit the scope of the present invention.

[0030] A specific embodiment of the present invention, such as figure 1 shown, combined with figure 2 , discloses a detonation wave waveform test method, comprising the following steps:

[0031] S1, sequentially connect and assemble the detonator 1, the booster charge 2, the main charge 3, the light-shielding shell 4, the partition 5, the fired charge 6, the high-speed scanning camera 7, the light-shielding cylinder 8, and multiple plexiglass plates 10. Flash light source 11;

[0032] S2, moving the high-speed scanning camera 7 back and forth until the light passing through the plurality o...

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Abstract

The invention relates to a waveform testing method of detonation waves, and belongs to the technical field of high-speed dynamic process testing. The waveform testing method comprises the following steps: S1, a detonator, a booster grain, a dispensing grain, a partition plate, a shading shell, a dispensed grain, a plurality of organic glass plates, a shading cylinder, a high-speed scanning cameraand a stroboscopic light source are connected in sequence; S2, the high-speed scanning camera is moved in the front-back direction till light penetrating through the multiple organic glass plates enters the high-speed scanning camera; S3, after the detonator is detonated, the dispensing grain is detonated through the booster grain, and the stroboscopic light source is turned on at the same time when the dispensing grain is detonated or after the specific time; and S4, the light entering the high-speed scanning camera is changed along with the propagation situation of the detonation waves, andthe complete waveforms of the detonation waves at multiple positions in the dispensed grain are obtained along with stage-by-stage detonation of different parts of the dispensed grain. Compared with the prior art, the waveforms of the detonation waves on different sections and end faces in an explosive are simultaneously measured effectively.

Description

technical field [0001] The invention relates to the technical field of wireless high-speed dynamic process testing, in particular to a detonation wave waveform testing method. Background technique [0002] High-speed photography is one of the important means to test the detonation waveform in explosives. Usually, the single-slit high-speed photographic test method is used to measure the moving speed, arrival time and outline of the measured target. For the study of explosive detonation waves, the single-slit high-speed photography test method can only measure the waveform of the detonation wave sweeping across the surface of the powder column. It is difficult to infer explosives from the surface detonation wave waveform by using this single-slit high-speed photography test method. The internal detonation conditions, and the detonation wave conditions at different positions inside the charge column cannot be tested and recorded at the same time. Other existing test methods ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/84
CPCG01N21/84
Inventor 刘彦黄风雷段卓平吕中杰吴艳青
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
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