Transformer parameter test system, transformer parameter test method and computer storage medium
A transformer parameter and test system technology, applied in the direction of instruments, measuring electronics, measuring devices, etc., can solve the problems of inconvenient automatic switching test, low test efficiency, complex circuit structure, etc., and achieve the goal of improving the automatic test process and improving the test efficiency Effect
Inactive Publication Date: 2019-09-06
裕文新兴电子(深圳)有限公司
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[0003] Existing test methods, one class separates the test circuit system adopted by the above three test items, when testing, the test item is connected to the corresponding test circuit system, and then the test result data is manually read and recorded; the other class , although at least two test items will be integrated in one test circuit system, on the one hand, the circuit structure is complex and difficult to control, on the other hand, the test process requires a high degree of manual intervention, the test process is slow, and the test process is inconvenient for automatic switching tests , the test efficiency is low
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[0041] As an embodiment of the present invention, all the switches of the electromagnetic control switch circuit are relay switches, wherein the relay switch set between the second end of the input coil and the first end of the first output coil is connected to the second end of the first output coil. The relay switch arranged between the terminal and the first terminal of the second output coil is the same relay switch, which is controlled to be turned off and turned on or cut off at the same time, which simplifies the circuit control structure and improves the test efficiency.
[0042] As an embodiment of the present invention, such as figure 1 As shown, the first load circuit includes a first resistor R1, and a conduction cut-off switch is connected in series, and the second load circuit includes a second resistor R2, and a conduction cut-off switch is connected in series; on the basis of this circuit, if For output voltage testing with auxiliary output coils, the hold cont...
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The invention relates to a transformer parameter test system, a transformer parameter test method and a computer storage medium. The test system comprises a test power source, a multimeter, a load circuit and an electromagnetic control switch circuit; the electromagnetic control switch circuit comprises a second switch Y02, a third switch Y03, a fourth switch Y04, a fifth switch Y05, a sixth switch Y06, a seventh switch Y07, an eighth switch Y08, a tenth switch Y10 and an eleventh switch Y11; a tested transformer comprises an input coil, a first output coil and a second output a coil; the first end of the input coil is connected to the other end of the second switch Y02, and the second end is connected to the other end of the third switch Y03; the first end of the first output coil is connected to the other end of the fifth switch Y05, and the second end is connected to the other end of the sixth switch Y06; and the first end of the second output coil is connected to the other end of the seventh switch Y07, and the second end is connected to the other end of the eighth switch Y08. Compared with the prior art, the test efficiency is improved under the condition of ensuring the testaccuracy.
Description
technical field [0001] The invention relates to the field of parameter testing of electronic equipment, in particular to a testing system, a testing method and a computer storage medium for parameter testing of transformer equipment. Background technique [0002] For transformer performance parameter detection items, including IPO (no-load input current or input excitation current) test items, phase / turn number test items and load output voltage test items, it is used to detect whether the corresponding requirements are met, so as to obtain the performance of the transformer Eligibility. [0003] Existing test methods, one class separates the test circuit system adopted by the above three test items. When testing, the test item is connected to the corresponding test circuit system, and then the test result data is manually read and recorded; the other class , although at least two test items will be integrated in one test circuit system, on the one hand, the circuit structu...
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IPC IPC(8): G01R31/00G01R31/02
CPCG01R31/00G01R31/62
Inventor 陆文伟刘伟谢俊朋
Owner 裕文新兴电子(深圳)有限公司