Asymmetric differential magnetic field probe structure
A magnetic field probe, asymmetric technology, applied in the size/direction of the magnetic field, magnetic field measurement using electromagnetic devices, etc., can solve the problems of resonance, energy coupling increase, error, etc., to improve the electric field suppression ratio and weaken the resonance interference , the effect of widening the working bandwidth
Active Publication Date: 2019-09-20
SHANGHAI JIAO TONG UNIV
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In this stacked differential magnetic field probe structure, the signal layer of the first detection part and the signal layer of the second detection part are placed vertically. Therefore, as the frequency increases, the gap between the first detection part and the second detection part The energy coupling of the will increase, causing it to resonate, causing errors
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[0040] The present invention will be described in detail below in conjunction with specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that those skilled in the art can make several changes and improvements without departing from the concept of the present invention. These all belong to the protection scope of the present invention.
[0041] Such as Figure 1 to Figure 3 As shown, the asymmetric differential magnetic field probe structure in this case includes two parts, the left detection part and the right detection part, and there is an area difference between the first detection part and the second detection part. The left detection part is used to induce an external magnetic field to generate an electromagnetic signal A, and output the electromagnetic signal A; the right detection part is used to induce an external magnetic fiel...
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The invention provides an asymmetric differential magnetic field probe structure. The asymmetric differential magnetic field probe structure comprises: a first detection portion used for inducing an external magnetic field to generate and output a first electromagnetic signal; a second detection portion used for inducing an external magnetic field to generate and output a second electromagnetic signal, wherein the first detection portion and the second detection portion have an area difference, and the first electromagnetic signal and the second electromagnetic signal form a differential signal. The output signal difference formed by the area difference provides the high spatial resolution for the magnetic field probe, and meanwhile, the common mode rejection design is performed by utilizing a differential structure, so that the electric field rejection ratio of the magnetic field probe is improved.
Description
technical field [0001] The invention relates to the field of near-field scanning equipment, in particular to an asymmetric differential magnetic field probe structure. Background technique [0002] With the development of electronic technology, the size of chips has become smaller and smaller, the degree of integration has become higher and higher, and the wiring has become more and more dense, which has caused the problem of electromagnetic interference to become more and more serious. Therefore, accurate measurement of the electromagnetic field strength radiated by components such as circuit boards, chips, and antennas can help us optimize product design and solve electromagnetic interference problems. [0003] The magnetic field probe can be used to measure the magnetic field intensity radiated from components such as circuit boards, and its main performance includes sensitivity, spatial resolution and electric field suppression ratio. Sensitivity refers to the ability o...
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IPC IPC(8): G01R33/06
CPCG01R33/06
Inventor 李晓春彭至鹤毛军发
Owner SHANGHAI JIAO TONG UNIV