Capacitor detection device

Abstract

The invention provides a capacitor detection device. The device comprises a rack, a turntable and a plurality of rotation mechanisms, wherein the rack is provided with a plurality of stations; the plurality of stations are alternately arranged around the center of the turntable; a support seat for supporting a capacitor is arranged on the turntable so that the capacitor passes through the stationsin sequence under the driving of the turntable; the turntable has a turntable initial position and a rotation position which is lifted for a predetermined height relative to the turntable initial position, so that the turntable can rotate when moving to the rotation position and move to the turntable initial position when finishing the rotation; the plurality of rotation mechanisms are arranged to correspond to the plurality of detection stations one by one and each rotation mechanism is arranged on the corresponding detection station; and the rotation mechanisms are arranged below the turntable so that the rotation mechanisms are connected with the capacitor through through holes of the support seat and through holes of the turntable so as to drive the capacitor to rotate when the turntable moves to the turntable initial position. The device is capable of solving the problem that the capacitor detection devices are relatively low in detection efficiency in the prior art.

Description

technical field

[0001] The present invention relates to the technical field of capacitance, in particular, to a capacitance detection device. Background technique

[0002] With the continuous development of industrial automation, the automation level of capacitor production is getting higher and higher, and unmanned workshops are gradually being realized. Capacitor quality inspection is an important part of capacitor production, which affects product quality and product production efficiency.

[0003] However, the detection efficiency of the capacitive side appearance detection system in the prior art is not high, and the above defects cannot be integrated into one system for implementation. In addition, the appearance inspection system on the capacitor side can only detect defects on the side of the capacitor, but cannot detect defects on the top and upper and lower edges, and there is also a problem of low detection efficiency. Moreover, the electronic device appearance ...

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