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Image collection method and image collection device

An image acquisition device and image acquisition technology, which are applied in the field of optical test technology and materials, can solve the problem of unable to solve the problem of image acquisition of the test piece, unable to obtain the visual field image clearly and so on.

Active Publication Date: 2019-11-01
TSINGHUA UNIV
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Problems solved by technology

[0002] At present, in high-temperature environments, especially in high-speed wind tunnels and flame ablation test environments, especially in environments with large brightness gradients, the existing methods of using CCD cameras to collect images can only obtain clear images of parts of objects, and cannot clearly obtain All field of view images cannot solve the problem of image acquisition with large brightness gradients on the surface of the specimen

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  • Image collection method and image collection device
  • Image collection method and image collection device
  • Image collection method and image collection device

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Embodiment Construction

[0053] Various exemplary embodiments, features, and aspects of the present disclosure will be described in detail below with reference to the accompanying drawings. The same reference numbers in the figures indicate functionally identical or similar elements. While various aspects of the embodiments are shown in drawings, the drawings are not necessarily drawn to scale unless specifically indicated.

[0054] The word "exemplary" is used exclusively herein to mean "serving as an example, embodiment, or illustration." Any embodiment described herein as "exemplary" is not necessarily to be construed as superior or better than other embodiments.

[0055] In addition, in order to better illustrate the present disclosure, numerous specific details are given in the following specific implementation manners. It will be understood by those skilled in the art that the present disclosure may be practiced without some of the specific details. In some instances, methods, means, componen...

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Abstract

The disclosure relates to an image collection method and an image collection device, which are applied to high-temperature environments. The method includes: determining an exposure value of each timeof exposure according to an initial exposure value and a total exposure amount; collecting an image of a to-be-tested object according to the exposure value of each time of exposure and an exposure window corresponding to current exposure, wherein exposure windows of all exposure are sequentially adjacent, and an intersection region of adjacent exposure windows exists; and carrying out image splicing on the obtained image to form a full-visual-field image. The embodiment of the disclosure can carry out image collection on global shape and appearance of a tested object in a high-temperature environment.

Description

technical field [0001] The disclosure relates to the field of optical test technology and material technology, and in particular to an image acquisition method and an image acquisition device. Background technique [0002] At present, in high-temperature environments, especially in high-speed wind tunnels and flame ablation test environments, especially in environments with large brightness gradients, the existing methods of using CCD cameras to collect images can only obtain clear images of parts of objects, and cannot clearly obtain All field of view images cannot solve the problem of image acquisition with large brightness gradients on the surface of the specimen. Contents of the invention [0003] In view of this, the present disclosure proposes an image acquisition method and an image acquisition device, so as to perform image acquisition in a high-temperature environment and obtain clear images in a full field of view. [0004] According to an aspect of the present ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/00G01B11/02G01B11/16
CPCG01J5/00G01B11/02G01B11/16G01J2005/0077G01J5/485
Inventor 冯雪唐云龙张金松岳孟坤方旭飞
Owner TSINGHUA UNIV
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