A Reliability Test Method for Instrument Electric Control System

Abstract

The invention discloses a reliability test method of an instrument electric control system, comprising: collecting historical fault data of the electric control system and storing them in a fault database; The failure rate of each component of the component; determine the component with a failure rate greater than or equal to 50% as the test component; according to the type of failure of the test component, determine a certain number of reliability tests for the electronic control system each of the several test items is implemented on the test components, and the test data is recorded; according to the test data, the reliability of the electric control system is determined. Through the present invention, the pertinence of the product reliability test can be improved, the failure of the product can be quickly detected, the test cycle is greatly shortened, and it is beneficial for the research and development personnel to quickly obtain the reliability of the product, and better control the electronic control system of the product. Improve and improve product quality.

Description

technical field [0001] The invention relates to the field of reliability testing, in particular to a reliability testing method of an instrument electric control system. Background technique [0002] With the increasingly fierce market competition, there are more and more high-reliability and long-life products in the field of civilian household appliances. If the conventional reliability and life test methods are used to evaluate the reliability and life characteristics of the product, it is necessary to test all the components contained in the electronic control system of the instrument, and the test items for the electronic control system of the instrument are the same, so that Not only will it take an unbearable time cost, but even before the test is completed, the product has been updated or eliminated due to backward performance, and the test of the electronic control system of different instruments is not targeted, which is not conducive to the rapid discovery of the ...

AI Technical Summary

Problems solved by technology

If the conventional reliability and life test methods are used to evaluate the reliability and life characteristics of the product, it is necessary to test all the components contained in the electronic control system of the instrument, and the test items for the electronic control system of the instrument are the same, so that Not only will it take an unbearable time cost, but even before the test is completed, the product has been updated or eliminated due to backward performance, and the test of the electronic control system of different instruments is not targeted, which is not conducive to the rapid discovery of the electronic control system of the instrument. System fault location

Obviously, such a long test time and low test pertinence not only miss the best time to improve product reliability, but also seriously affect the progress of research and development, which is unacceptable in engineering practice

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