Power grid n-k fault analysis and screening method and device based on impact increment

A technology of fault analysis and screening methods, which is applied in the direction of circuit devices, electrical components, AC network circuits, etc., can solve problems such as increased fault probability and number of faults, difficult high-impact fault sets, and difficult to accurately predict fault probability, achieving accuracy and Coordinated and controllable speed, reduced calculation amount, and improved weight effect

Active Publication Date: 2022-06-17
NORTHEAST DIANLI UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Under extreme weather conditions, the failure probability and number of failures of equipment will increase significantly, and the failure probability is difficult to predict accurately, which effectively solves the problem that traditional probability-based screening methods will be difficult to obtain a comprehensive set of high-impact failures, and it is difficult to maintain a high For the problem of computational efficiency, see the following description for details:

Method used

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  • Power grid n-k fault analysis and screening method and device based on impact increment
  • Power grid n-k fault analysis and screening method and device based on impact increment
  • Power grid n-k fault analysis and screening method and device based on impact increment

Examples

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Embodiment 1

[0046] N-k fault impact calculation method based on impact increment, see figure 1 , the embodiments of the present invention will be described in further detail below. 101-113 are the detailed steps of the calculation method.

[0047]101: Input IEEE RTS 79 system data, including: N-k fault order, accurately calculated low-order fault state order N CTG value and initialization fault order k=1;

[0048] 102: Use the independence criterion to judge the independence among all branch devices;

[0049] 103: Create k-order state set Ω according to formula (4) s k ;

[0050] 104: From the state set Ω s k Select IEEE RTS 79 System Status s;

[0051] 105: Determine whether the faulty devices in the state s are independent of each other, if the components are independent of each other, go back to step 104; otherwise, go to step 106;

[0052] 106: Calculate the effect of IEEE RTS 79 system state s using the OPF algorithm I s ;

[0053] 107: Calculate the influence increment ΔI...

Embodiment 2

[0074] The scheme in Example 1 is further introduced below in conjunction with specific calculation formulas and examples, and the details are described below:

[0075] 201: Obtain the calculation formula of the impact increment based on the reliability index calculation formula of the impact increment, and then obtain the standard calculation formula of the N-k fault impact based on the impact increment;

[0076] The traditional state enumeration method reliability index formula is as follows:

[0077]

[0078] In the formula, I(s) is the influence function of the system state s, that is, the load reduction amount (MW) of the system state s, and P(s) is the probability of occurrence of s.

[0079] According to formula (1), the calculation formula of reliability index based on influence increment is derived:

[0080]

[0081] In the formula, ΔI s is the influence increment of the system state s, which can be calculated by formula (3), u i is the unavailability rate of...

Embodiment 3

[0125] In the following, with reference to specific examples, for the N-k fault analysis and screening method based on the impact increment proposed in the embodiment of the present invention, this example takes the IEEE RTS79 node system as an example to carry out simulation analysis and verification. The IEEE RTS79 node system topology diagram is as follows Figure 5 shown in the following description:

[0126] The IEEE RTS 79 system includes 32 generators, 33 transmission lines, 5 transformers, and 17 load nodes, with a total installed capacity of 3405MW and a maximum system load of 2850MW.

[0127] 1) Analysis of calculation accuracy

[0128] The State ENumeratioN method (SE) is used to enumerate all possible N-1, N-2 and N-3 faults in the IEEE RTS 79 test system. , IISE) to calculate the influence of each order of fault states. Since the number of N-4 and N-5 faults is too large, when using the Monte Carlo method (MoNte Carlo method, MCS) to sample N-4 and N-5 faults, t...

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Abstract

The invention discloses a power grid N-k fault analysis and screening method and device based on the influence increment. The method includes: obtaining the influence I of the k-order system state s And the corresponding impact increment; decompose the impact of the system's high-order N-k fault state into low-order fault states, and use the impact increment of the low-order fault state to calculate the impact I of the N-k fault state s ; Filter the output fault set to improve the efficiency of N-k fault analysis. The device includes: a memory, a processor, and a computer program stored on the memory and operable on the processor, and the processor implements the method steps described in the claims when executing the program. The invention realizes the rapid calculation of the influence of the high-order fault state by utilizing the limited analysis results of the low-order fault state, and screens the fault state which threatens the system the most from the angle of influence.

Description

technical field [0001] The invention relates to the field of electric power systems, in particular to a method and device for analyzing and screening N-k faults in power grids based on influence increments. Background technique [0002] As the scale of the power system continues to expand, the power grid has developed into one of the most complex man-made networks in the world, and its operational safety is critical to the national economy. In recent years, extreme weather such as typhoons, low temperatures and continuous rain and snow have frequently appeared in the north and south of my country, causing extensive damage to power facilities and greatly affecting the safety of power grid operations. For example, in September 2005, the strong typhoon "Dawei" caused a large number of line trips in Hainan Power Grid, leading to the collapse of the main network, causing large-scale power outages in the province, with a total loss of 62.5% of the load and economic losses of more ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H02J3/00
CPCH02J3/00
Inventor 李雪姜涛孙霆锴侯恺陈厚合李国庆张儒峰张嵩
Owner NORTHEAST DIANLI UNIVERSITY
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