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A digital logic automatic test device and method

An automatic test device, digital logic technology, applied in the direction of measurement device, electronic circuit test, electrical test/monitoring, etc., can solve the problems of high cost, long debugging cycle, complex test process, etc., to achieve the effect of meeting the cost

Active Publication Date: 2020-11-17
ETOWNIP MICROELECTRONICS BEIJING CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Automated testing is fast, high-level, and comprehensive, so it is widely used in mass product testing, but its cost is high, the testing process is complicated, and the debugging cycle is long

Method used

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  • A digital logic automatic test device and method
  • A digital logic automatic test device and method
  • A digital logic automatic test device and method

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Experimental program
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Embodiment 1

[0082] Such as figure 1 As shown, a kind of digital logic automatic testing device provided by the present invention comprises: input serial register, input register, test module, output register and output serial register, external data is controlled through standard JTAG interface (TMS, TCK, TDI line) Entering the input serial register, the external high-frequency clock signal is respectively input into the input register, the test module, and the output register. After the test is completed, the test result is stored in the output register, and directly connected to the output serial register in parallel, also through the standard JTAG interface (TDO line) to control the output.

[0083] The standard JTAG interface includes 4 lines: TMS, TCK, TDI, TDO, which are mode selection, clock, data input and data output lines respectively.

[0084] Signal number of digits direction describe o_RespData 256 O Observe the response of internal logic i_CfgC...

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PUM

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Abstract

A digital logic automatic test device and method. The test device comprises an input serial register, an input register, a test module, an output register, and an output serial register which are connected in sequence; the input serial register is configured to receive external data scanned in via a standard JTAG interface and then send the external data into the input register in parallel; the input register is configured to input the received external data into the test module; the test module is configured to perform test according to the external data and an external input start signal on the basis of an operating mode in the external data, and store, after the test is completed, a test result in the output register; the output register is configured to input the test result into the output serial register in parallel; the output serial register is configured to scan out the received test result via the standard JTAG interface. According to the device and method provided in the solution, targeted test can be performed for the function and performance of logic to be tested, and the maximum operating frequency can be accurately tested.

Description

technical field [0001] The invention relates to the technical field of chip testing, in particular to a digital logic automatic testing device and method. Background technique [0002] After the design of the chip is completed and the tape-out is returned, it is generally necessary to test the chip to verify whether the functions on the chip are correct and whether the performance meets the requirements. However, the existing test devices can only verify the overall function and performance of the chip, and cannot accurately test the highest operating frequency of the logic of a single part inside the chip, resulting in one-sided and inaccurate test results, which in turn lead to the failure of the chip. Estimates of functionality and performance will also be inaccurate. [0003] Moreover, the current integrated circuit testing includes manual testing and automated testing. Automated testing is fast, high-level, and comprehensive, so it is widely used in mass product testi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05B23/02G01R31/28
CPCG01R31/2851G05B23/0218
Inventor 吴汉明朱敏
Owner ETOWNIP MICROELECTRONICS BEIJING CO LTD