Uniformity calibration method for TEM chamber field of concentric cone

Abstract

The invention discloses a uniformity calibration method for TEM chamber field of concentric cone, which comprises the steps of placing a field intensity probe into the center of an uniformity area fora concentric cone TEM chamber field, and recording the field intensity probe as an initial position; adjusting the input frequency of an TEM chamber to a lower limit test frequency, feeding in constant forward power capable of generating standard field intensity, and recording the field intensity reading and forward power of the initial position; keeping the forward power unchanged and determining a first position, a second position, a third position and a fourth position in different directions around the initial position so that the area formed by the four positions can surround the field intensity probe, and the absolute value of the difference between the field intensity of the field intensity probe and the field intensity of the initial position is not larger than a set range; adjusting the input frequency to the upper limit of the test frequency in a stepping mode, repeating the steps, to acquire the uniformity area for the concentric cone TEM chamber field. The uniformity calibration method for the TEM chamber field of the concentric cone fills the blank of a conventional uniformity calibration method for anTEM chamber field of a concentric cone, and field uniformity calibration can be rapidly and accurately carried out.

Description

technical field [0001] The present application relates to the field of field uniformity calibration, in particular to a field uniformity calibration method for a concentric cone TEM chamber. Background technique [0002] According to the IEC61000-4-20 standard, the field uniformity of the TEM chamber is calibrated by the constant power method and the constant field strength method. The constant power calibration method is to input a constant forward power to the port of the TEM chamber, and then use a calibrated field strength probe to measure each position point in each frequency band with a specified step size. [0003] The calibration procedure is: place the field probe at a measurement point in the TEM room, adjust the frequency of the signal generator to the lower limit frequency of the test frequency range; input a constant forward power to the port of the TEM to make the field strength of the field probe spindle When the reading is within the field strength range all...

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Problems solved by technology

[0007] In view of this, this application provides a concentric cone TEM chamber field uniformity calibration method to solve the problems of low accuracy and slow speed of existing calibration methods

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