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Non-destructive inspection method

An inspection method and non-destructive technology, applied in the field of non-destructive inspection, can solve problems such as shape changes and unstable shape features

Pending Publication Date: 2020-05-05
KONICA MINOLTA INC +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0010] However, for inspection objects that are laminated and packaged like LIB, the shape characteristics are not stable, and there is a possibility that the shape changes from the previous inspection to the next inspection
In addition, in the invention described in Patent Document 1, there is an optical search by taking an image with a camera or the like before any inspection, and a process for specifying the position before the inspection is required, and the addition of a camera, etc. The problem of increasing the size of the device

Method used

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Embodiment Construction

[0028] Hereinafter, one embodiment of the present invention will be described with reference to the drawings. The following is an embodiment of the present invention and does not limit the present invention.

[0029] The inspection object is inspected using a plurality of non-destructive inspection units of different kinds. The plurality of non-destructive inspection units of different types include any two or more of an X-ray imaging unit, a magnetic field distribution measurement unit, a thermal imaging imaging unit, and a hardness measurement unit. In this embodiment, a case where an X-ray imaging device including an X-ray imaging unit and a magnetic field distribution measuring device including a magnetic field distribution measuring unit are mainly used is taken as an example. The X-ray imaging device and the magnetic field distribution measuring device are independent devices, and the inspection object moves between the two devices for inspection by these devices, so th...

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Abstract

The purpose of the present invention is to simply and accurately set the positions on an object to be inspected which are identified in detection results of each of a plurality of different types of non-destructive inspection means, when inspecting the object to be inspected using the plurality of different types of non-destructive inspection means. When inspecting an object to be inspected usinga plurality of different types of non-destructive inspection means, common marks (m1, m2, m3) capable of being detected by any of the plurality of non-destructive inspection means are fixedly formed on the object (1) to be inspected, the object to be inspected including the marks is subsequently detected by each of the plurality of non-destructive inspection means, and the detection results from the plurality of non-destructive inspection means are compared using the marks as positional references.

Description

technical field [0001] The present invention relates to non-destructive inspection methods. Background technique [0002] There is a desire to use multiple non-destructive inspection units of different types to inspect the inspection object, for example, to inspect lithium-ion batteries by X-ray imaging devices (X-ray Talbot imaging devices, etc.) is "LIB"). By X-ray imaging, structural failures inside the LIB, the presence or absence of foreign objects, and their positions can be known. In addition, by measuring the magnetic field distribution, the current distribution inside the LIB can be visualized, and the magnitude of the leakage current and the location of the leakage can be known. [0003] In the actual inspection, it is not necessary to make a judgment based on each result alone, but to make a multi-faceted judgment by combining the detection results of both. For example, even if a foreign substance is found by X-ray imaging, it may be considered okay if it does ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/041G01J5/48G01N3/40G01N27/83H01M10/04
CPCH01M10/04G01J5/48G01N3/40G01N23/041G01N27/83G03B42/028Y02P70/50Y02E60/10A61B6/484G01N23/083G01N23/223G03B42/025
Inventor 今田昌宏波多野卓史关根孝二郎土田匡章八木司
Owner KONICA MINOLTA INC
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