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Method for realizing rapid tilting of crystal with shaft

A crystalline, axis-bearing technique for applications in the field of transmission electron microscopy

Active Publication Date: 2020-05-08
SHANGHAI TECH UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In addition, a similar method was recently developed at KAUST University in Saudi Arabia, but this method is only applicable to the case where the crystal zone axis deviates by plus or minus 5 degrees

Method used

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  • Method for realizing rapid tilting of crystal with shaft
  • Method for realizing rapid tilting of crystal with shaft
  • Method for realizing rapid tilting of crystal with shaft

Examples

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Embodiment Construction

[0047] Below in conjunction with specific embodiment, further illustrate the present invention. It should be understood that these examples are only used to illustrate the present invention and are not intended to limit the scope of the present invention. In addition, it should be understood that after reading the teachings of the present invention, those skilled in the art can make various changes or modifications to the present invention, and these equivalent forms also fall within the scope defined by the appended claims of the present application.

[0048] A method for realizing fast tilting of the crystal zone axis provided by the present invention can quickly calculate the position of the double-tilt sample rod corresponding to the zone axis for researchers according to the input electron diffraction pattern and sample structure information.

[0049] Specifically, the method provided by the present invention can achieve the following two functions: (A) When the crystal i...

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Abstract

The invention relates to a method for realizing rapid tilting of a crystal with a shaft, and different methods are adopted for processing when the crystal is not on a specified belt shaft or when thecrystal is close to one belt shaft but slightly deviates towards the direction. Another technical scheme of the invention is to provide an application of the method for realizing rapid tilting of thecrystal with the shaft, and the method is characterized in that the method for realizing rapid tilting of the crystal with the shaft is realized by utilizing computer program programming. The invention discloses an idea for calculating the rotation direction and angle of a double-inclination sample rod in a transmission electron microscope. The belt axis of the current crystal can be judged by using an electron diffraction pattern through a program, the double-tilting-rod tilting angle required for rotating to a specified belt axis is rapidly calculated, and the crystal slightly deviating fromthe belt axis is adjusted to a correct position according to a Laue ring.

Description

technical field [0001] The invention provides a method for rapidly rotating a crystal to a specific band axis when using a transmission electron microscope to shoot electron diffraction patterns and high-resolution images, and belongs to the technical field of transmission electron microscopy. Background technique [0002] Transmission electron microscopy is widely used in materials, chemistry, biology and other fields. The two main functions are to take selected area electron diffraction patterns and high-resolution images. The prerequisites for realizing these two functions need to rotate the crystal to Specific belt shaft. In most cases, operators use experience to tilt the crystal. This process not only takes a lot of time and effort, but also may damage the crystal due to prolonged electron beam irradiation. [0003] In previous reports, the researchers used convergent electron beam diffraction to determine the crystal's band axis, but strong electron beams can disrupt...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/04G01N23/20058G01N23/20025
CPCG01N23/04G01N23/20058G01N23/20025
Inventor 马延航严睿文张韵豪孙凸
Owner SHANGHAI TECH UNIV