A transmission line pulse test system
A technology for transmission line pulse and pulse testing, which is applied in the direction of pulse characteristic measurement, measuring device, and current-only measurement, and can solve problems such as inability to accurately detect current pulses, bandwidth limitations, and current jumps
Active Publication Date: 2022-08-05
INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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[0003] In the existing TLP system, the probe for detecting current passes through the core wire of the transmission line and is connected in series in the TLP system, so that the probe for detecting current is as close as possible to the object under test, so as to obtain a relatively complete waveform and improve the test accuracy. However, the existing In the TLP system, the technical parameters of the current probe and the stripping of the transmission line will cause bandwidth limitation and current jump problems
[0004] Therefore, existing transmission line pulse generators cannot accurately detect current pulses
Method used
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[0033] Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided so that the present disclosure will be more thoroughly understood, and will fully convey the scope of the present disclosure to those skilled in the art.
[0034] The embodiment of the present invention provides a transmission line pulse test system, such as figure 1 shown, including: a pulse generating device, a pulse testing device;
[0035] Wherein, the output end of the pulse generating device is connected to the pulse testing device, and the pulse generating device inputs the generated pulse signal into the pulse testing device.
[0036] The pulse test device includes a ...
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The invention relates to the technical field of electrostatic discharge protection, in particular to a transmission line pulse testing system, comprising: a pulse generating device and a pulse testing device; an output end of the pulse generating device is connected to a pulse testing device; the pulse testing device comprises a sequentially connected current detection device , a first transmission line, a coaxial relay group, and a test probe, the test probe is used to connect the first connection end of the object to be tested, the coaxial relay group includes a first port, and the first port is connected to the first transmission line; the pulse test device also includes an oscilloscope , the oscilloscope includes a first input end and a second input end, the first input end is connected to the current detection device, and the second input end is connected to the second connection end of the object to be measured; the oscilloscope is based on the detected progress through the current detection device. wave and the superimposed wave of the forward wave and the reflected wave at the object to be measured, so as to calculate the accurate current waveform at the object to be measured, and provide effective simulation parameters for the electrostatic discharge protection structure.
Description
technical field [0001] The invention relates to the technical field of electrostatic discharge protection, in particular to a transmission line pulse testing system. Background technique [0002] The transmission line pulse generator (TLP) is used to measure the IV curve of the device in the process of being subjected to electrostatic pulses, and provides the required simulation parameters for the global protection structure of electrostatic discharge (ESD) protection. Most ESD protection will use the transmission line pulse generator. [0003] In the existing TLP system, the probe for detecting current is connected in series in the TLP system through the core wire of the transmission line, so that the probe for detecting current is as close as possible to the object to be measured, so as to obtain a relatively complete waveform and improve the test accuracy. In the TLP system, the problem of bandwidth limitation and current jump will be caused due to the technical parameter...
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IPC IPC(8): G01R19/00G01R29/02
CPCG01R19/0092G01R29/02
Inventor 曾传滨王娟娟倪涛孙佳星罗家俊韩郑生王玉娟张煦
Owner INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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