A method, device, and equipment for performing simulation tests on smart devices
A smart device and simulation testing technology, applied in software testing/debugging, error detection/correction, instruments, etc., can solve problems such as time-consuming and affecting the effect of application testing
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Embodiment 1
[0105] In view of the above problems, the present invention proposes a method for simulation testing of smart devices, which is applied to simulation testing of smart devices. If it is applied to simulation testing of large-area simulation scenarios, the efficiency of simulation testing can be greatly improved and the simulation time can be shortened. testing time. Such as figure 2 As shown, the method includes the following steps:
[0106] Step S201, dividing the environment space to be simulated to obtain multiple subspaces and corresponding subenvironment data;
[0107] The simulation test of smart devices needs to simulate the environmental space in which smart devices may operate. The environmental space here can be understood as a three-dimensional space. The environmental data describing the environmental space can be information such as area, coordinates, object identifiers in the space, and object identifiers in the space. , the environmental data exists on the com...
Embodiment 2
[0189] The present invention provides a device 600 for performing simulation tests on smart devices, including a memory and a processor, as shown in the attached Figure 6 shown, where:
[0190] The memory 602 is used to store computer programs;
[0191] The processor 601 is configured to read the program in the memory and execute:
[0192] Divide the environment space to be simulated to obtain multiple subspaces and their corresponding subenvironment data;
[0193] When subspace loading is triggered, the subenvironment data corresponding to the subspace is loaded for simulation, and the simulated operation of the simulated subspace is performed on the smart device for application testing;
[0194] When it is determined that the switching condition is met during the test, the current running state of the device for the simulation test of the smart device is maintained, and the subspace adjacent to the subspace where the device for the simulation test of the smart device is cur...
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