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Sensor testing machine and sensor testing method

A technology for testing machines and testing methods, applied in the direction of electrical components, etc., can solve problems such as adverse effects of product testing, and achieve the effects of reducing adverse effects, reducing impacts, and reducing vibrations

Inactive Publication Date: 2020-09-15
无锡韦感半导体有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The interference from the ground vibration caused by the product transmission channel (for vibration feeding), other equipment resonance, people walking and vehicles passing by will directly act on the test product, which will have an adverse effect on the product test

Method used

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  • Sensor testing machine and sensor testing method
  • Sensor testing machine and sensor testing method
  • Sensor testing machine and sensor testing method

Examples

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Embodiment Construction

[0026] Various embodiments of the invention will be described in more detail below with reference to the accompanying drawings. In the various drawings, the same elements are denoted by the same or similar reference numerals. For the sake of clarity, various parts in the drawings have not been drawn to scale. Also, some well-known parts may not be shown in the drawings.

[0027] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. In the following, many specific details of the present invention, such as structures, materials, dimensions, processes and techniques of components, are described for a clearer understanding of the present invention. However, the invention may be practiced without these specific details, as will be understood by those skilled in the art.

[0028] It should be understood that when describing the structure of a component, when a layer or ...

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PUM

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Abstract

The invention discloses a sensor testing machine and a sensor testing method. According to the embodiment of the invention, the sensor testing machine comprises a feeding port used for inputting a to-be-tested product, a test fixture used for bearing the to-be-tested product and serving as a test place of the to-be-tested product, and a product conveying channel connected with the feeding port andthe test fixture and used for conveying the to-be-tested product, and the feeding port is located above the test fixture so that the to-be-tested product can slide to the test fixture from the product conveying channel under the action of gravity. According to the sensor testing machine and the sensor testing method provided by the embodiment of the invention, the influence of vibration on sensortesting can be reduced.

Description

technical field [0001] The invention relates to the technical field of sensor testing, in particular to a sensor testing machine and a sensor testing method. Background technique [0002] The existing Micro-Electro-Mechanical System (MEMS, Micro-Electro-Mechanical System) microphone testing device is composed of a mechanical controller, a product transmission channel and a test fixture, and is used for testing the Micro-Electro-Mechanical System and the like. [0003] figure 1 A schematic diagram of an application scenario of a test device according to the prior art is shown. Such as figure 1 As shown, the existing test device 1 is easily subject to vibration interference from equipment such as product transmission channels and external vibration interference during the testing process. In the prior art, the products input from the material inlet are fed by vibration, and then tested in the test fixture. The interference from the ground vibration caused by the product tr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04R29/00
CPCH04R29/004H04R29/005
Inventor 谭海峰
Owner 无锡韦感半导体有限公司