Application test method, electronic equipment and storage medium

Abstract

The embodiment of the invention relates to the field of testing, and discloses an application testing method, electronic equipment and a storage medium. The method comprises the steps of obtaining feature information of an application; generating a test rule of a control in the application according to the feature information; and performing automatic traversal test on the controls in the application according to the test rule, and generating a test result. The test rule is generated according to the directly acquired feature information, so that the labor cost required for compiling the script can be reduced, the compiling difficulty of the test script is simplified, and the test efficiency is improved. And besides, the control of the application is tested based on the collected feature information, so that the test content is more flexible, the test business scene is enriched, the test coverage rate is improved, and the test result is more comprehensive.

Description

technical field [0001] The embodiments of the present invention relate to the field of testing, and in particular to an application testing method, electronic equipment, and a storage medium. Background technique [0002] With the development of terminal equipment, in order to meet the needs of users, the functions of the application program interface developed by developers are becoming more and more abundant. While realizing rich functions, the application program is also prone to operational problems. The program is tested to detect problems that may arise in the application in advance. When testing an application, a large amount of code is usually manually written to simulate the operation of the application, and possible problems in the application are obtained according to the test results. [0003] The inventors found that there are at least the following problems in related technologies: testers need to write different codes for different controls to conduct simulat...

AI Technical Summary

Problems solved by technology

[0003] The inventors found that there are at least the following problems in related technologies: testers need to write different codes for different controls to conduct simulation tests. When there are many types and quantities of controls in the application program, the difficulty of writing is greatly increased, and the writing of codes Low efficiency, reducing the efficiency of testing

On the other hand, the number of codes written by testers is limited, and the test scenarios are limited, which leads to the fact that the test results cannot cover all application scenarios of the application, and the test scenario coverage is low.

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