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A fault detection method based on integrated learning of ica and svm

A technology of fault detection and integrated learning, which is applied in the direction of specific mathematical models, reasoning methods, and comprehensive factory control, etc., can solve problems such as the inability to directly determine whether there is a fault, and achieve the effect of improving detection accuracy and stabilizing the detection effect

Active Publication Date: 2022-05-20
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Application Information

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Problems solved by technology

[0003] In the prior art, the fault detection in the industrial process is carried out by setting the measuring equipment to obtain the working data of the industrial production system, but the measuring equipment can only obtain the working data of the industrial production system and cannot directly draw the conclusion of whether there is a fault, so how to Fault detection based on the data obtained by measuring equipment and improving the accuracy of fault detection have become the focus of research in this field

Method used

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  • A fault detection method based on integrated learning of ica and svm
  • A fault detection method based on integrated learning of ica and svm
  • A fault detection method based on integrated learning of ica and svm

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Embodiment Construction

[0091] The specific embodiments of the present invention are described below so that those skilled in the art can understand the present invention, but it should be clear that the present invention is not limited to the scope of the specific embodiments. For those of ordinary skill in the art, as long as various changes Within the spirit and scope of the present invention defined and determined by the appended claims, these changes are obvious, and all inventions and creations using the concept of the present invention are included in the protection list.

[0092] Such as figure 1 As shown, the fault detection method based on ICA and SVM integrated learning includes the following steps:

[0093] S1. Obtain the measurement data of the target industrial production system from the measuring equipment under different working conditions of the target industrial production system, and include the measurement data at different times under the same working condition into a matrix, and...

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Abstract

The invention discloses a fault detection method based on ICA and SVM integrated learning, which adopts Bayesian reasoning to integrate the ICA model with feature extraction ability and the SVM model with classification ability, and utilizes the different advantages of different models, Thereby improving the detection accuracy and making the detection effect more stable.

Description

technical field [0001] The invention relates to the field of fault detection in industrial processes, in particular to a fault detection method based on integrated learning of ICA and SVM. Background technique [0002] Modern industrial production has become more and more large-scale and complex. If there is a failure in the production process, it will not only affect the quality of the product, but also easily pose a threat to human life. Therefore, fault detection technology is often used to monitor industrial production conditions. [0003] In the prior art, the fault detection in the industrial process is carried out by setting the measuring equipment to obtain the working data of the industrial production system, but the measuring equipment can only obtain the working data of the industrial production system and cannot directly draw the conclusion of whether there is a fault, so how to Fault detection based on the data obtained by measuring equipment and improving the ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/27G06K9/62G06N5/04G06N7/00
CPCG06F30/27G06N5/04G06N7/01G06F18/2134G06F18/2411Y02P90/02
Inventor 凡时财邹见效张季阳徐红兵
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA