A screen defect automatic testing method based on POS machine model

A technology of automated testing and POS machines, applied in testing optical performance, cash registers, instruments, etc., to reduce time costs, improve testing efficiency, and reduce manual testing errors

Active Publication Date: 2022-05-20
AITIWEIER ELECTRONICS TECH BEIJING
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] The object of the present invention is to provide a kind of automatic testing method of screen defect based on POS machine model, thus solve the foregoing problems existing in the prior art

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  • A screen defect automatic testing method based on POS machine model

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Embodiment Construction

[0022] In order to make the object of the present invention, the technical solution and advantages more clearly understood, the following in conjunction with the accompanying drawings, the present invention will be further elaborated in detail. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to qualify the present invention.

[0023] as Figure 1As shown in the present embodiment, there is provided an automated test method for screen defects based on pos machine models, comprising the following steps,

[0024] S1, the PC end and the POS machine to be tested is connected; the PC side sends a collection instruction containing model information to the POS machine to be tested;

[0025] S2, the POS machine to be tested receives the acquisition instruction;

[0026] S3, the POS machine to be tested to determine whether the model in the acquisition instruction is the same as its own model, if so, t...

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Abstract

The invention discloses a method for automatically testing screen defects based on the model of a POS machine, comprising: S1, connecting a PC end to the POS machine to be tested; the PC end sends a collection instruction including model information to the POS machine to be tested; S2, the POS machine to be tested Test the POS machine to receive the collection command; S3, the POS machine to be tested judge whether the model in the collection command is the same as its own model, if so, then perform step S4; The information fed back by the POS machine to be tested changes the model information, generates a new collection command, and returns to step S2; S4, the POS machine to be tested collects its own screen pixel information according to the collection command, and converts the screen pixel information The array is transmitted to the PC side; and other steps. The advantages are: this method can effectively detect whether the screen pixels of different models of POS machines are damaged; and it can improve the efficiency of screen pixel testing, reduce manual testing errors, and reduce time costs.

Description

Technical field [0001] The present invention relates to the pos machine screen defect testing technology field, in particular to a pos machine model based on the pos machine model of the screen defect automated test method. Background [0002] Pos machine in order to be able to accurately and completely display screen information, need to check the screen pixel damage ratio of each model and each machine, manual inspection wastes a lot of time, inefficient, easy to make mistakes. Contents of the Invention [0003] Object of the present invention is to provide an automated test method for screen defects based on pos machine models, thereby solving the foregoing problems present in the prior art. [0004] In order to achieve the above objects, the technical solution employed in the present invention is as follows: [0005] An automated screen defect test method based on POS machine model, including the following steps, [0006] S1, the PC end and the POS machine to be tested is co...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02G07G1/12
CPCG01M11/02G07G1/12
Inventor 肖二辉祁兵刘福标卢建兴
Owner AITIWEIER ELECTRONICS TECH BEIJING
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