Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Debugging control circuit and debugging control method

A circuit and controller technology, applied in the direction of control/adjustment system, program control, and adjustment of electrical variables, etc., can solve problems such as chip leakage, reduce the risk of leakage, improve the matching requirements of debugging mode, and reduce the risk of entering the debugging mode by mistake Effect

Active Publication Date: 2021-11-12
上海琻捷电子科技有限公司
View PDF10 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Compared with the normal working mode, the chip has higher operating authority in the debugging mode, and the information of the chip is easily leaked from the debugging mode

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Debugging control circuit and debugging control method
  • Debugging control circuit and debugging control method
  • Debugging control circuit and debugging control method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] The technical solutions in the embodiments of the present application will be described below with reference to the drawings in the embodiments of the present application. In the description of the present application, the terms "first", "second" and the like are only used for distinguishing descriptions, and cannot be understood as indicating or implying relative importance.

[0021] Such as figure 1 As shown, the present embodiment provides a debugging control system, including: a debugging control circuit 10 and a chip 20, wherein the debugging control circuit 10 is connected to the chip 20 to control whether the chip 20 enters the debugging mode, so as to avoid the chip 20 entering into the debugging mode by mistake. Risk of information leakage caused by debug mode.

[0022] Such as figure 2 As shown, this embodiment provides a debugging control circuit 10, including: a memory 11, a window generator 12, a random generator 13 and a controller 14, wherein:

[0023...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The application provides a debugging control circuit and a debugging control method, the circuit includes: a window generator, used to receive a debugging instruction for the chip, and generate a debugging window signal; a controller, connected to the window generator, used to The debugging window signal, analyzing the debugging instruction, and reading the identification information of the chip; a random generator, connected to the controller, for generating a random sequence according to the analysis result of the debugging instruction and the identification information; The controller is further configured to generate a debugging key according to the random sequence, and control the chip to enter a debugging mode according to the debugging key and the debugging instruction. This application generates the enable signal of the chip debugging mode through the unique identification information of the chip and the random sequence of the pseudo-random number generator. Risk of Information Leakage.

Description

technical field [0001] The present application relates to the field of circuit technology, in particular, to a debugging control circuit and a debugging control method. Background technique [0002] When the chip is working, it is generally divided into normal working mode, test mode and debugging mode. During the chip production process, there will be some manufacturing defects, and the problematic chips need to be screened out in the test mode. In the chip development stage, it is necessary to debug the firmware in the debug mode. Compared with the normal working mode, the chip has a higher operating authority in the debugging mode, and the information of the chip is easily leaked from the debugging mode. Therefore, a method for safely entering the debugging mode is needed to prevent the chip from entering the debugging mode by mistake when it is in the normal working mode, resulting in leakage of chip information. Contents of the invention [0003] The purpose of the...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F21/70
CPCG05B19/0423G05F1/56
Inventor 罗许喜徐红如刘楷
Owner 上海琻捷电子科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com