Constant-temperature test box for electronic products
A technology of electronic products and test boxes, which is applied in the field of test devices, can solve problems affecting the accuracy of constant temperature testing, temperature drift, and constant temperature test errors, and achieve the effects of improving the accuracy of constant temperature testing, saving energy, and saving energy
Active Publication Date: 2020-12-04
SHENZHEN MICROBT ELECTRONICS TECH CO LTD
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Problems solved by technology
[0004] However, it was found that the actual temperature of the constant temperature test box will produce temperature drift compared with the set target temperature, which will bring errors to the constant temperature test of electronic equipment and seriously affect the accuracy of the constant temperature test
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[0044] In order to better understand the above-mentioned technical solution, the above-mentioned technical solution will be described in detail below in conjunction with the accompanying drawings and specific implementation methods.
[0045] The inventors of the present application found that in the existing solutions, the temperature drift caused by the actual temperature of the constant temperature test box compared with the set target temperature is due to the heat generated by the electronic equipment during testing, and the heat is continuously accumulated in the constant temperature test box And caused. Therefore, how to get rid of this heat or even make use of it is the problem that the present invention focuses on.
[0046]The embodiment of the present application provides a constant temperature test box for electronic products, the constant temperature test box includes an inner box unit 10, an outer box unit 20, an air outlet channel 41 and an air inlet channel 42; w...
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The invention discloses a constant-temperature test box for electronic products. The constant-temperature test box comprises an inner box unit and an outer box unit which sleeves the inner box unit, an air inlet channel and an air outlet channel which are independent of each other are communicated between the inner box unit and the outer box unit, and then electronic equipment is arranged in the inner box unit. The fan air outlet of the electronic equipment is communicated with the air outlet channel; and a backflow channel is further communicated between the air outlet channel and the inner box unit. Therefore, on one hand, heat generated by the electronic equipment during testing can be discharged out of the outer box unit from the air outlet channel, and on the other hand, the heat canflow back to the inner box unit through the backflow channel so as to heat the electronic equipment; and the technical problems of temperature drift and influence on test accuracy due to the fact thatheat generated by the electronic equipment is continuously accumulated in the constant-temperature test box are solved, the technical effect of improving the constant-temperature test accuracy of theelectronic equipment is achieved, and energy can be saved.
Description
technical field [0001] The invention relates to the technical field of testing devices, in particular to a constant temperature test box for electronic products. Background technique [0002] For electronic equipment, due to the difference in the specific use environment, especially the temperature in the environment, it is usually necessary to perform performance tests on the electronic equipment in a constant temperature environment at different temperatures before use, so as to ensure that the electronic equipment can operate under different temperature environments. normal work. [0003] The above-mentioned performance tests at different temperatures usually need to be carried out in a constant temperature test box. Most of the existing constant temperature test boxes have a box structure integrating a cooling module and a heating module, and then the cooling module or the heating module are separated in the box. Create environments with different target temperatures to...
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IPC IPC(8): B01L1/00B01L7/00G01R31/00
CPCB01L1/00B01L7/00G01R31/003
Inventor 王俊友巫跃凤高阳杨作兴
Owner SHENZHEN MICROBT ELECTRONICS TECH CO LTD