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Three-dimensional measurement method, device and terminal equipment for reflective objects

A three-dimensional measurement and reflection technology, applied in the field of three-dimensional measurement, can solve the problems of three-dimensional measurement of objects that cannot reflect light, and achieve the effect of improving accuracy

Active Publication Date: 2022-07-12
SHENZHEN INST OF ADVANCED TECH CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In view of this, the embodiments of the present invention provide a three-dimensional measurement method, device and equipment for reflective objects to solve the problem that three-dimensional measurement of reflective objects cannot be performed

Method used

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  • Three-dimensional measurement method, device and terminal equipment for reflective objects
  • Three-dimensional measurement method, device and terminal equipment for reflective objects
  • Three-dimensional measurement method, device and terminal equipment for reflective objects

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Embodiment 1

[0052] like figure 1 As shown, it is a schematic flowchart of a three-dimensional measurement method for a reflective object provided by Embodiment 1 of the present invention. This embodiment is applicable to the application scenario of three-dimensional measurement of reflective objects, and the method can be performed by a three-dimensional measurement device for reflective objects, which can be a control device or a terminal tablet, a PC or a server, etc.; The three-dimensional measurement device of the reflective object is described as the execution subject, and the method specifically includes the following steps:

[0053] S110. Acquire a first photographed image, where the first photographed image is obtained by projecting a preset first average luminance image onto the surface of the object to be measured.

[0054] In order to realize the three-dimensional measurement of the object to be measured whose surface is reflective, the three-dimensional measurement of the obj...

Embodiment 2

[0099] like Figure 7 What is shown is a three-dimensional measuring device for a reflective object provided by the second embodiment of the present invention. On the basis of the first embodiment, the embodiment of the present invention also provides a three-dimensional measuring device 7 for a reflective object, which includes:

[0100] A first captured image acquisition module 701, configured to acquire a first captured image, where the first captured image is obtained by projecting a preset first average luminance image onto the surface of the object to be measured;

[0101] a projection coordinate determination module 702, configured to determine the projection coordinates of the reflective area on the surface according to the first captured image;

[0102] A brightness adjustment function determination module 703, configured to determine the brightness adjustment function of each projection coordinate position in the reflective area according to the projection brightnes...

Embodiment 3

[0121] Figure 8 It is a schematic structural diagram of a terminal device provided in Embodiment 4 of the present invention. The terminal device includes a processor 81, a memory 82, and a computer program 83 stored in the memory 82 and executable on the processor 81, such as a program for a three-dimensional measurement method of reflective objects. When the processor 81 executes the computer program 83, the steps in the above-mentioned embodiments of the three-dimensional measurement method for reflective objects are realized, for example, figure 1 Steps S110 to S170 are shown.

[0122] Exemplarily, the computer program 83 may be divided into one or more modules, and the one or more modules are stored in the memory 82 and executed by the processor 81 to complete the present application. The one or more modules may be a series of computer program instruction segments capable of performing specific functions, and the instruction segments are used to describe the execution p...

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Abstract

The present application belongs to the technical field of three-dimensional measurement, and provides a three-dimensional measurement method, device and terminal equipment for a reflective object. The method includes: acquiring a first photographed image, where the first photographed image is to project a preset first average brightness image After reaching the surface of the object to be measured, it is obtained by shooting; according to the first shot image, the projection coordinates of the reflective area on the surface are determined; according to the projection brightness and the shooting brightness, the brightness adjustment function of each projection coordinate position in the reflective area is determined; Acquiring a second captured image, the second captured image is obtained by projecting a preset measurement image onto the surface; the preset measurement image is the area where the projected coordinates in the original measurement image are located through the brightness adjustment function obtained after adjusting the brightness of the object; performing three-dimensional reconstruction on the second captured image to obtain a three-dimensional image of the object to be measured. The embodiments of the present application solve the problem that three-dimensional measurement of reflective objects cannot be performed.

Description

technical field [0001] The present invention relates to the technical field of three-dimensional measurement, and in particular, to a three-dimensional measurement method, device and terminal equipment of a reflective object. Background technique [0002] In order to accurately obtain the three-dimensional information of the object, the three-dimensional measurement of the object is usually performed by the structured light three-dimensional scanning technology. The structured light 3D scanning system usually consists of a projection device and a camera. The projection device projects a pattern containing predetermined encoded information onto the surface to be tested, and the camera records the encoded pattern modulated by the surface to be tested. The camera image plane and projection are resolved by decoding means. The global unique matching problem between the image planes of the equipment, so that the three-dimensional information of the surface to be measured can be ca...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
CPCG01B11/2527
Inventor 唐苏明谷飞飞宋展
Owner SHENZHEN INST OF ADVANCED TECH CHINESE ACAD OF SCI