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Method and system for adaptive determination of wide-band electromagnetic response of an integrated circuit

An integrated circuit and broadband technology, applied in the field of broadband electromagnetic response adaptive determination method and system, can solve the problems of low calculation accuracy, high calculation time cost, and the number of sampling points of the frequency cannot reach thousands, and avoid the Resonance, the effect of reducing computational time cost

Active Publication Date: 2021-03-30
北京智芯仿真科技有限公司
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Problems solved by technology

[0003] The purpose of the present invention is to provide a method and system for adaptively determining the wide-band electromagnetic response of integrated circuits, so as to solve the problem that the number of sampling points for frequency cannot reach thousands when using traditional methods such as uniform frequency point sampling to calculate the electromagnetic response of integrated circuits. A problem that leads to low calculation accuracy and high calculation time cost

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[0050] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0051] The object of the present invention is to provide a method and system for adaptively determining the electromagnetic response of an integrated circuit in a wide frequency band, which can accurately calculate the electromagnetic response of the integrated circuit with a small number of sampling frequency points, reducing the calculation time cost.

[0052] In order to make the above objects, features and advantages of the present invention more comprehens...

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Abstract

The invention relates to a method and system for self-adaptive determination of wide-band electromagnetic response of an integrated circuit. The method includes: obtaining the frequency range of the integrated circuit to be simulated, and setting a plurality of uniformly distributed initial frequency points according to the frequency range; calculating the electromagnetic response of the initial frequency point using a coarse-grained parallel method, and determining the first electromagnetic response sequence and the second Electromagnetic response sequence; based on the cubic spline interpolation method, the first electromagnetic response sequence and the second electromagnetic response sequence are interpolated to obtain the first cubic spline interpolation curve and the second cubic spline interpolation curve, and determine the difference curve; according to The peak value of the difference curve and the peak value of the first cubic spline interpolation curve determine the set of discrete frequency points; the electromagnetic response of each discrete frequency point in the set of discrete frequency points is determined by using a coarse grain parallel method. The electromagnetic response of the integrated circuit can be accurately calculated with a small number of sampling frequency points, which reduces the calculation time cost.

Description

technical field [0001] The invention relates to the field of integrated circuit design, in particular to a method and system for self-adaptive determination of wide-band electromagnetic response of integrated circuits. Background technique [0002] For the ultra-broadband electromagnetic field calculation problem of multi-layer VLSI, the frequency range that needs to be calculated includes a wide frequency range from several kHz to several GHz. As the minimum feature size of multi-layer VLSI is reduced to the nanometer level, integrated circuits The operating frequency reaches several GHz, and the crosstalk, voltage drop, signal delay, noise and other problems caused by parasitic effects between layers, vias, interconnections, etc. are becoming more and more serious. It is very necessary to analyze the electromagnetic response in a wide frequency band. Due to the multi-scale structure of multi-layer VLSI with a minimum feature size of nanometers and a maximum size of centim...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/373
CPCG06F30/373
Inventor 唐章宏邹军王芬黄承清汲亚飞
Owner 北京智芯仿真科技有限公司
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