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Knowledge point difficulty grading method based on big data

A technology of knowledge points and big data, applied in the field of data processing, can solve problems such as difficult to grasp knowledge points, automatic calculation of big data, and low difficulty of questions

Inactive Publication Date: 2021-02-09
SHANGHAI SQUIRREL CLASSROOM ARTIFICIAL INTELLIGENCE TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

It is difficult to grasp the difficulty of the knowledge points in the above-mentioned question-making method, and it cannot automatically calculate the difficulty of the knowledge points of the relevant test questions based on the collected big data. It is easy to appear that the difficulty of the questions is too high or too low, which is not conducive to students' learning and teachers. teaching students in accordance with their aptitude

Method used

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  • Knowledge point difficulty grading method based on big data
  • Knowledge point difficulty grading method based on big data
  • Knowledge point difficulty grading method based on big data

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Embodiment Construction

[0046] The preferred embodiments of the present invention will be described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.

[0047] The invention provides a method for grading the difficulty of knowledge points based on big data. The technical solution can automatically judge the difficulty of corresponding knowledge points according to the collected big data.

[0048] Such as figure 1 as shown, figure 1 It is a schematic workflow diagram of an implementation method of the method for grading the difficulty of knowledge points based on big data in the present invention; a method for grading the difficulty of knowledge points based on big data in the present invention can be implemented as steps S10-S40 as described below:

[0049] Step S10, obtaining all the questions corresponding to the...

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Abstract

The invention discloses a knowledge point difficulty grading method based on big data, and the method comprises the steps: obtaining all questions corresponding to a target knowledge point, and forming a corresponding test question bank through all questions corresponding to the target knowledge point; providing questions in the test question bank to a target user for the target user to answer, and obtaining answer information and answer duration corresponding to the target user; calculating the complexity of an examination question corresponding to the target knowledge point according to theanswer information and the answer duration of the target user; determining the difficulty level of the target knowledge point according to the calculated complexity of the examination questions of thetarget knowledge point; and the purpose of automatically judging the difficulty levels of the related knowledge points according to the collected big data is achieved.

Description

technical field [0001] The invention relates to the technical field of data processing, in particular to a method for grading the difficulty of knowledge points based on big data. Background technique [0002] At present, the difficulty level of knowledge points learned by students is usually manually grasped and judged by the person who made the question or the teacher who made the question. At the same time, with the continuous development and progress of computer technology, more and more teachers use the method of automatically generating questions, such as using computers to randomly select corresponding questions from the question bank according to the corresponding question types to generate test papers. It is difficult to grasp the difficulty of the knowledge points in the above-mentioned question-making method, and it cannot automatically calculate the difficulty of the knowledge points of the relevant test questions based on the collected big data. It is easy to ap...

Claims

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Application Information

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IPC IPC(8): G06Q50/20G06F17/18
CPCG06F17/18G06Q50/205
Inventor 许昭慧
Owner SHANGHAI SQUIRREL CLASSROOM ARTIFICIAL INTELLIGENCE TECH CO LTD
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