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Waste equipment overwriting scheme library building method based on loop test

A technology of loop testing and solution library, applied in static memory, instruments, etc., can solve problems such as user privacy and national security threats

Pending Publication Date: 2021-02-09
BEIJING UNIV OF TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The private file data stored in the device cannot be deleted directly, which poses a serious threat to the user's personal privacy and even national security

Method used

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  • Waste equipment overwriting scheme library building method based on loop test
  • Waste equipment overwriting scheme library building method based on loop test
  • Waste equipment overwriting scheme library building method based on loop test

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Experimental program
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Embodiment Construction

[0016] This application proposes a method for building a waste equipment overwriting scheme library based on cyclic testing, including an information extraction module, an overwriting scheme execution module, an overwriting scheme effect evaluation module, an overwriting test module, and an overwriting scheme library. The specific structure is as follows figure 1 shown.

[0017] (1) Information extraction module

[0018] The input of this module is the device to be cleared, and the output is the storage space and image file data before overwriting. Comparative evaluation.

[0019] (2) Overwrite the program execution module

[0020] The input of this module is the equipment to be cleared and the overwriting scheme, and the output is the overwritten equipment and the identified equipment to be cleared that failed to match. Its main function is to identify the equipment to be cleared and match it with the scheme samples in the overwriting scheme library, so that Determine the ...

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Abstract

The invention discloses a waste equipment overwriting scheme library building method based on a loop test. The method comprises an information extraction module, an overwriting scheme execution module, an overwriting scheme effect evaluation module, an overwriting test module and an overwriting scheme library. The purpose of continuously expanding the scheme library is achieved by analyzing and circularly testing unknown equipment models in the overwriting scheme library.

Description

technical field [0001] The invention belongs to the technical field of electronic equipment, and in particular relates to a method for building a waste equipment overwriting scheme library based on a cycle test. Background technique [0002] In recent years, the replacement speed of electronic equipment has exceeded its scrapping frequency, and the replaced waste electronic equipment is either left idle or sold. According to statistics, most people choose to use selling means to dispose of waste equipment in their hands. [0003] At present, due to the lack of relevant laws and regulations, the second-hand recycling industry's treatment of waste equipment is limited to cleaning the appearance and restoring equipment data. The private file data stored in the device cannot be deleted directly, which poses a serious threat to the user's personal privacy and even national security. In order to avoid waste of resources and ensure the security of users' personal information, the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/36G11C29/38
CPCG11C29/36G11C29/38
Inventor 汤健王天峥周晓钟王丹丹
Owner BEIJING UNIV OF TECH