Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Chip drive program test method and device, equipment and readable storage medium

A driver and testing method technology, applied in the field of equipment and computer-readable storage media, devices, and chip driver testing methods, can solve the problems of error-prone, time-consuming and labor-intensive, etc., so as to improve accuracy, save manpower and save energy. The effect of hardware resources

Inactive Publication Date: 2021-03-09
SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
View PDF0 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

If you remove the previous hardware environment, reconfigure it into a new hardware environment, and manually configure it repeatedly, error-prone, time-consuming and labor-intensive

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Chip drive program test method and device, equipment and readable storage medium
  • Chip drive program test method and device, equipment and readable storage medium
  • Chip drive program test method and device, equipment and readable storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0052] see figure 1 , figure 1 It is an implementation flowchart of a method for testing a chip driver in an embodiment of the present invention, and the method may include the following steps:

[0053] S101: Analyze the received test request to obtain the target chip driver to be tested.

[0054] When it is necessary to test the chip driver, the request sender generates a test request and sends the test request to the test management center, where the test request includes the target chip driver to be tested. The test management center receives the test request, and analyzes the received test request to obtain the target chip driver to be tested.

[0055] The test management center mainly plays the role of task scheduler and resource manager.

[0056] S102: Generate an environment configuration list corresponding to the target chip driver.

[0057] After analyzing and obtaining the target chip driver to be tested, the test management center generates an environment configur...

Embodiment 2

[0070] see figure 2 , figure 2 It is another implementation flowchart of the chip driver testing method in the embodiment of the present invention, and the method may include the following steps:

[0071] S201: Analyze the received test request to obtain the target chip driver and the identification of each test case.

[0072] After creating multiple test cases, set a specific test case ID for each test case. In addition to the target chip driver, the test request may also include test case identifiers. The test management center obtains the target chip driver and the identification of each test case by analyzing the received test request.

[0073] S202: Generate an environment configuration list corresponding to the target chip driver.

[0074] S203: Parallel search for target test cases corresponding to each test case ID from the test case library through the standard API, and send each target test case to the target virtual machine.

[0075] The test case library is ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a chip drive program test method, which comprises the following steps of: analyzing a received test request to obtain a target chip drive program to be tested; generating an environment configuration list corresponding to the target chip driver; creating a target virtual machine according to the environment configuration list; obtaining each target test case corresponding to the target chip drive program, and sending each target test case to the target virtual machine; and executing each target test case by utilizing the target virtual machine to perform test operationon the target chip drive program. By applying the chip drive program test method provided by the invention, the release period of the drive program is shortened, hardware resources are saved, the accuracy of test environment configuration is improved, and manpower is saved. The invention further discloses a chip drive program testing device and equipment and a storage medium, and the correspondingtechnical effects are achieved.

Description

technical field [0001] The invention relates to the technical field of software development, in particular to a chip driver testing method, device, equipment and computer-readable storage medium. Background technique [0002] With the development of modern information technology, the user's requirements for the function and performance integration of the chip are constantly improving, and at the same time, the update speed of the chip driver is also required to be faster and faster. The driver is the bridge between the chip and the operating system, and the test of the driver has become an important link in the development of the chip driver. [0003] At present, the conventional driver testing method uses a main server (Jenkins master server) and some test servers to execute automation use cases. Each test server needs to install the physical chip to be tested, and configure the test server to be different according to the test case scenario type. Type, for example, some s...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3684G06F11/3688
Inventor 梁向峰崔健任鹏飞余洪斌
Owner SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com