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Side-channel test analysis method based on maximum probability density function distribution of mask variable

A technology of density function and test analysis, which is applied in the countermeasures of attacking encryption mechanism, digital transmission system, secure communication device, etc. It can solve the problems of increasing the amount of curves and increasing the cost, and achieve the effect of easy distinction and improved correlation level

Active Publication Date: 2022-07-12
NANJING AGRICULTURAL UNIVERSITY
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

The cost of side-channel test analysis for masking schemes will increase significantly, and the amount of curves required will increase accordingly

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  • Side-channel test analysis method based on maximum probability density function distribution of mask variable
  • Side-channel test analysis method based on maximum probability density function distribution of mask variable
  • Side-channel test analysis method based on maximum probability density function distribution of mask variable

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Embodiment Construction

[0038] Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals refer to the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, but not to be construed as a limitation of the present invention.

[0039] The present invention proposes a side channel test and analysis method based on the maximum probability density function distribution of mask variables. The distribution deviation of the post-mask variables corresponding to different mask values ​​in the mask set is used to calculate the probability density function distribution, and select the distribution in different sensitive areas. The maximum value under the variable, the enhanced side-channel test analysis for the mask scheme is...

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Abstract

The present invention proposes a side channel test analysis method based on the maximum probability density function distribution of mask variables. The probability density function distribution is calculated by using the post-mask variable distribution deviations corresponding to different mask values ​​in the mask set. The maximum value under the sensitive median yields an enhanced side-channel test analysis method oriented to the masking scheme. This method first pre-evaluates the mask set of the mask scheme, then calculates the probability density distribution of the hypothetical intermediate values ​​corresponding to all guessing keys under the mask set, and finally selects the maximum probability density distribution value as the hypothetical power consumption value, The correlation between the calculation and the actual power consumption is obtained, and the probability order of all guessed keys is obtained, and the correct key is recovered. The method of the present invention can be applied to a fixed mask scheme, and at the same time, the success rate of test analysis can be improved, and the amount of curves required for successful test analysis can be reduced.

Description

technical field [0001] The invention belongs to the security field of cryptographic chips, in particular to a side channel test and analysis method based on the distribution of the maximum probability density function of mask variables. Background technique [0002] Side-channel test analysis is an effective method for cryptographic chip evaluation. This type of test analysis uses the power consumption, electromagnetic and other energy consumption characteristic information leaked during the operation of the cryptographic chip to establish a relationship with the intermediate value of the cryptographic algorithm key. So as to achieve the effect of recovering the key, it has become a serious threat to the cryptographic chip. [0003] In order to resist the side-channel test and analysis, most of the existing cryptographic chips use a mask scheme as a protection method. The idea of ​​the mask scheme is to introduce random numbers, split the key-related variables in the origina...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04L9/00
CPCH04L9/002Y02D30/70
Inventor 李延斌任守纲唐明黄玉鑫徐焕良
Owner NANJING AGRICULTURAL UNIVERSITY