Parallelism detection jig and parallelism adjustment method
A technology for detecting jig and parallelism, which can be used in measuring devices, optical instrument testing, testing optical performance, etc., and can solve problems such as inaccurate adjustment.
Pending Publication Date: 2021-04-27
O FILM IMAGE TECH (GUANGZHOU) CO LTD
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Problems solved by technology
[0006] Based on this, it is necessary to provide a parallelism detection fixture and an adjustment method for the parallelism in order to solve the inaccurate adjustment of the existing parallelism adjustment method of the test surface of the resolution board and the light incident surface of the camera module.
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[0025] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar improvements without departing from the connotation of the present invention, so the present invention is not limited by the specific implementations disclosed below.
[0026] It should be noted that when an element is referred to as being “fixed” to another element, it can be directly on the other element or there can also be an intervening element. When an element is referred to as being "connected to" another element, it can be directly connected ...
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The invention relates to a parallelism detection jig and a parallelism adjustment method. The jig is used for detecting whether a first surface and a second surface which are opposite at an interval are parallel, and comprises: a base capable of being placed on the first surface, and two light emitters arranged on the base in a spaced mode and capable of emitting light beams to the second surface at the same time, wherein the light beams can be reflected by the second surface and finally projected to the base. According to the invention, whether the first surface and the second surface are parallel can be judged through the position relation between the two light emitters and the position relation between the projection positions of the two light beams on the base; and the jig can directly detect whether the first surface and the second surface are parallel so as to detect whether the parallelism between the first surface and the second surface meets the requirements, i.e., the jig can directly detect whether the levelness between the resolution plate and the camera module meets the requirements so as to improve the detection precision, so that the levelness between the resolution plate and the camera module is improved.
Description
technical field [0001] The invention relates to the technical field of camera modules, in particular to a parallelism detection jig and a parallelism adjustment method. Background technique [0002] Such as figure 1 As shown, in the test of the camera module 200 , the resolution detection of the camera module 200 is a must-test item. Wherein, when detecting the resolution of the camera module 200, it is necessary to photograph the test surface 301 of the resolution board 300, the test surface 301 is the surface on which the resolution board 300 is provided with a Chart, and the distance between the resolution board 300 and the camera module 200 is The parallelism between them has a great influence on the test effect, and if the parallelism is too poor, it may directly lead to incomplete shooting of the resolution test surface 301. If the parallelism between the test surface 301 of the resolution board 300 and the light incident surface 201 of the camera module 200 is too p...
Claims
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IPC IPC(8): G01B11/26G01M11/02H04N17/00
CPCG01B11/26G01M11/0207H04N17/002
Inventor 钟应超
Owner O FILM IMAGE TECH (GUANGZHOU) CO LTD