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IO test method

A test method and technology to be tested, applied in the field of IO testing, can solve the problems of low testing efficiency, multiple labor costs, and inability to meet the needs of high-capacity industries, and achieve the effect of saving labor costs and improving testing efficiency.

Active Publication Date: 2021-04-30
LCFC HEFEI ELECTRONICS TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this method requires more labor costs, and the detection efficiency is low, which cannot meet the needs of high-capacity industries

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0067] Please refer to figure 1 As shown, a kind of IO testing method provided for the embodiment of the present invention comprises the following steps:

[0068] S10 , controlling the transfer mechanism to transfer the carrier 10 carrying the product 20 to be inspected to the inspection station of the inspection platform 11 .

[0069] refer to figure 2 As shown, in this embodiment, the implementation of the IO testing method needs to rely on the IO testing equipment 100, and the IO testing equipment specifically includes: rack 1, first transmission mechanism 2, second transmission mechanism 3, jacking transmission mechanism 4. Clamping and positioning mechanism 5, two sets of grasping mechanisms 6 and a plurality of IO plugs 7, wherein the detection platform 11 is arranged on the frame 1, and a plurality of IO plugs 7 are arranged on both sides of the detection platform 11, and the detection platform Both sides of 11 are provided with grabbing mechanisms 6, and each grabbi...

Embodiment 2

[0098] refer to Figure 9 As shown, on the basis of Embodiment 1, preferably, the following steps are further included: S60, transferring the carrier 10 to the conveying mechanism of the inspected product; wherein, the first conveying mechanism 2 includes the conveying mechanism 21 of the product to be inspected and the Detected product delivery mechanism 22, the tested product delivery mechanism 22 is located below the untested product delivery mechanism 21, and the underside of the untested product delivery mechanism 21 and the tested product delivery mechanism 22 are both equipped with jacking delivery mechanisms 4. Specific steps are as follows:

[0099] S601. After the test is completed, control the lifting mechanism 9 located below the second conveying mechanism 3 to lower the carrier 10 to a second set position, wherein the second set position corresponds to the tested product conveying mechanism 22;

[0100] S602. Control the jacking conveying mechanism 4 located belo...

Embodiment 3

[0113] On the basis of embodiment two, preferably, the following steps are also included:

[0114] S90. The control pressure sensor detects the insertion pressure of the IO plug 7 inserted into the IO socket; when the insertion pressure exceeds a predetermined threshold, the control alarm sends out an alarm.

[0115] Wherein, the pressure sensor is arranged on the three-axis moving module 61 for detecting the insertion pressure of the IO plug 7 into the IO socket. Utilizing the pressure sensor can ensure the validity of the insertion of the IO plug 7. On the one hand, there will be no poor connection, and on the other hand, it can also avoid damage to the IO plug 7 or the product 20 to be detected due to excessive insertion force, thereby improving the accuracy of the IO detection. safety.

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Abstract

The invention discloses an IO test method. The method comprises the following steps: enabling a conveying mechanism to convey a carrier carrying a to-be-detected product to a detection station of a detection platform; enabling a clamping and positioning mechanism to clamp and fix the to-be-detected product so as to limit the relative position of the to-be-detected product; enabling grabbing mechanisms positioned on two sides of the detection platform to drive a visual positioning device to acquire position information of each IO socket on two sides of the to-be-detected product; according to the position information, enabling the grabbing mechanisms located on the two sides of the detection platform to grab IO plugs located on the two sides of the detection platform to be inserted into corresponding IO sockets, and carrying out IO detection through corresponding detection software; and after the set duration is reached, enabling the grabbing mechanisms on the two sides of the detection platform to pull out the IO plugs inserted into the two sides of the to-be-detected product and putting the IO plugs back to original positions for next IO detection. By utilizing the IO test method, automatic IO detection of the to-be-detected product can be realized so that the labor cost is saved, and the detection efficiency is improved.

Description

technical field [0001] The invention relates to the field of IO detection, in particular to an IO test method. Background technique [0002] After the notebook computer is produced, it needs to be tested by IO to ensure that the performance of the notebook computer meets the production requirements. [0003] The IO detection of the notebook computer includes: USB detection, Type C detection, HDMI detection, VGA detection, SD card detection, Audio Jack detection, RJ45 detection, etc. Since there are many types that need to be detected, and different types of notebook computers need to be detected, the types of detection are also different. Therefore, the existing notebook IO tests are all performed manually. The tester inserts the IO plug into the corresponding IO of the notebook computer. Socket, and then perform IO detection through the corresponding detection software. However, this method requires more labor costs, and the detection efficiency is low, which cannot meet ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/04G01R31/01
CPCG01R1/0416G01R1/0425G01R31/01
Inventor 朱翔赵云建于小建吴宗喜郭东明
Owner LCFC HEFEI ELECTRONICS TECH
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