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IO test equipment and IO test system

A testing equipment and technology to be tested, applied in the field of IO testing, can solve problems such as low testing efficiency, inability to adapt to the needs of high-capacity industries, and multiple labor costs

Active Publication Date: 2021-04-13
LCFC HEFEI ELECTRONICS TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this method requires more labor costs, and the detection efficiency is low, which cannot meet the needs of high-capacity industries

Method used

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  • IO test equipment and IO test system
  • IO test equipment and IO test system
  • IO test equipment and IO test system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0046] Please refer to figure 1 As shown, it is an IO test device 100 provided by the embodiment of the present invention, which includes: a frame 1, a first transmission mechanism 2, a second transmission mechanism 3, a jacking transmission mechanism 4, a clamping positioning mechanism 5, two sets of Grabbing mechanism 6 and a plurality of IO plugs 7.

[0047] A detection platform 11 is arranged on the frame 1, and a plurality of said IO plugs 7 are provided on both sides of the detection platform 11, and the middle part of the detection platform 11 is provided with the first transmission mechanism 2, and the first transmission mechanism 2 can move along the first The carrier 10 is conveyed in a direction to drive the carrier 10 to enter or leave the detection station, wherein the first direction is parallel to the upper surface of the detection platform 11; the second transmission mechanism 3 is arranged on the front end of the frame 1, and can move The carrier 10 is convey...

Embodiment 2

[0060] refer to Figure 9 As shown, the embodiment of the present invention also provides an IO test system, which includes a plurality of IO test devices 100, the plurality of IO test devices 100 are arranged at intervals along the second direction, and the second transmission mechanism 3 of each IO test device 100 is sequentially connected so that the carrier 10 can be sent to any idle IO testing device 100 for IO testing of the product to be tested.

[0061] In this embodiment, since a plurality of IO test equipment 100 is set, during a specific test, a plurality of products to be tested 20 can be placed on the product to be tested conveying mechanism 31 of the second conveying mechanism 3, when the first IO When the testing equipment 100 is in working condition, the product 20 to be tested will automatically flow to the second IO testing equipment 100, and when the second IO testing equipment 100 is also in working condition, the product 20 to be tested will automatically ...

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PUM

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Abstract

The invention discloses IO test equipment and an IO test system, the IO test equipment comprises a rack, a first transmission mechanism, a second transmission mechanism, a jacking transmission mechanism, a clamping positioning mechanism, two sets of grabbing mechanisms and a plurality of IO plugs, and the second transmission mechanism transmits a carrier carrying a to-be-detected product to a set position; the jacking transmission mechanism jacks up the carrier in a third direction and begins to convey the carrier to the first transmission mechanism in the first direction so as to drive the carrier to enter a detection station; in the second direction, the clamping and positioning mechanism clamps the to-be-detected product; a visual positioning device on the grabbing mechanism acquires position information of each IO socket on the to-be-detected product; the grabbing mechanisms on the two sides of the testing platform grab the IO plugs on the two sides respectively to be inserted into the corresponding IO sockets, and IO detection is conducted through corresponding detection software; and after IO detection is completed, the grabbing mechanisms on the two sides of the detection platform grab the IO plugs on the two sides again and put the IO plugs back to the original positions. Therefore, the detection efficiency is improved.

Description

technical field [0001] The invention relates to the field of IO testing, in particular to an IO testing device and an IO testing system. Background technique [0002] After the notebook computer is produced, it needs to be tested by IO to ensure that the performance of the notebook computer meets the production requirements. [0003] The IO detection of the notebook computer includes: USB detection, Type C detection, HDMI detection, VGA detection, SD card detection, Audio Jack detection, RJ45 detection, etc. Since there are many types that need to be detected, and different types of notebook computers need to be detected, the types of detection are also different. Therefore, the existing notebook IO tests are all performed manually. The tester inserts the IO plug into the corresponding IO of the notebook computer. Socket, and then perform IO detection through the corresponding detection software. However, this method requires more labor costs, and the detection efficiency ...

Claims

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Application Information

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IPC IPC(8): G01R31/28
CPCG01R31/28
Inventor 朱翔赵云建于小建吴宗喜郭东明
Owner LCFC HEFEI ELECTRONICS TECH
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