A single equipment quality evaluation method based on failure probability and equipment status
A technology of failure probability and quality evaluation, applied in data processing applications, instruments, calculations, etc., can solve the problems of not considering the state change data, not being accurate and precise, and not specifying the mathematical model of equipment quality characterization parameters, so as to achieve accurate prediction results. , evaluate the accurate effect
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[0037]The technology of the present invention will be described in detail below with reference to the specific embodiments. It should be understood that the following specific embodiments are only used to help those skilled in the art to understand the present invention, but not to limit the present invention.
[0038] This embodiment is a single device quality evaluation method based on failure probability and device status, such as figure 1 shown, it includes:
[0039] In the first step, it is assumed that the deterioration development of the state quantity x of the equipment with time conforms to the linear law expressed by formula (1). Even if the state quantity x does not change linearly with time, it can be transformed into a linear state Amount of change:
[0040] y i =x i +ε i =U i β+V i b i +ε i (1)
[0041] In the above formula, Indicates the actual state quantity deterioration value of the i-th device; Indicates the measured value of the state quantit...
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