Unlock instant, AI-driven research and patent intelligence for your innovation.

Bit error rate testing method and device

A technology of bit error rate and testing equipment, applied in the field of communication

Active Publication Date: 2022-03-08
HUAWEI TECH CO LTD
View PDF13 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, there is currently no BER test method suitable for transmission chips with asymmetric rates

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Bit error rate testing method and device
  • Bit error rate testing method and device
  • Bit error rate testing method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0045] In order to make the purpose, technical solutions and advantages of this application clearer, the technical solutions in this application will be clearly and completely described below in conjunction with the accompanying drawings in this application. Obviously, the described embodiments are part of the embodiments of this application , but not all examples. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of this application.

[0046] The terms "first" and "second" in the description, embodiments, claims and drawings of the present application are only used for the purpose of distinguishing descriptions, and cannot be interpreted as indicating or implying relative importance, nor can they be interpreted as indicating or imply order. Furthermore, the terms "comprising" and "having", as well as any variations thereof, are intended to cover a non-...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present application provides a bit error rate testing method and device. The bit error rate testing method of the present application includes: the test device sends the first sequence to the transmission device under test; the transmission device under test receives the third sequence, and the third sequence corresponds to the first sequence sent by the test device; the transmission device under test according to The third sequence and the second sequence obtain the first BER; the test device obtains the first BER from the transmission device under test; when the first BER is greater than or equal to the preset bit ratio, the test device sends the second sequence to the transmission device under test The transmission device under test receives the fourth sequence, the fourth sequence corresponds to the second sequence sent by the test device; the transmission device under test acquires a second BER according to the fourth sequence and the second sequence, and the second BER indicates the transmission device under test BER. This application can be applied to test the BER of the transmission device under test with asymmetric rate.

Description

technical field [0001] The present application relates to communication technology, in particular to a bit error rate testing method and device. Background technique [0002] Data transmission requires a transmission chip, and the bit error rate (BER) is an important index of the transmission chip. The BER test can be performed on the transmission chip to verify whether the transmission chip reaches the set BER index. [0003] In many communication systems, the rate of the transmission chip is asymmetrical, that is, the uplink rate and the downlink rate are not equal, and the difference is large. For example, the uplink rate of the transmission chip in the vehicle-mounted high-definition camera Direction) usually reaches 1Gbps~10Gbps, and its downlink rate is usually only 1Mbps~100Mbps. [0004] However, there is currently no BER test method suitable for transmission chips with asymmetric rates. Contents of the invention [0005] The present application provides a bit er...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H04L1/20
CPCH04L1/203
Inventor 王学寰张兴新鲍鹏鑫
Owner HUAWEI TECH CO LTD