Detection method of communication chip
A communication chip and detection method technology, applied in transmission monitoring, electrical components, transmission systems, etc., can solve the problems of inability to comprehensively detect the performance of communication chips, lack of function detection of communication chips, etc., and achieve the effect of comprehensive detection
Active Publication Date: 2021-07-09
浙江杭可仪器有限公司
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[0003] The traditional communication chip test is mainly to repeatedly perform basic read and write operation tests on the communication chip. This method can detect the basic read and write functions of the communication chip, but lacks the detection of the function of the communication chip, and cannot comprehensively test the communication chip performance
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[0027] In order to understand the specific technical solutions, features and advantages of the present invention more clearly, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0028] Such as figure 1 As shown, the present application discloses a detection method of a communication chip, including,
[0029] Step A: Read the ID information in the communication chip under test, respectively check whether the contact between the communication chip under test and the power supply is normal, and whether the communication between the communication chip and the signal generating unit is normal; if everything is normal, go to the next step; if not , then reconnect the line;
[0030] In the step A, the ID information includes the rated voltage, rated current, timing and function description of the communication chip. In this step, it is mainly judged whether the line contact is normal, whether the...
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The invention discloses a method for detecting a communication chip, which comprises the following steps of: a, reading ID information in a detected communication chip, and respectively checking whether the contact between the detected communication chip and a power supply is normal or not and whether the communication between the communication chip and a signal generation unit is normal or not; b, reading the output current of the power supply, and comparing the output current with the theoretical current; c, executing read-write operation on the communication chip by using a signal generation unit so as to detect whether the read-write function of the communication chip is normal or not; d, judging whether the internal register of the communication chip is invalid or not according to the execution result of the tested communication chip according to the set algorithm; e, inputting a function signal to the communication chip through the signal generation unit, and judging whether the function data output by the communication chip is consistent with expected data or not. By means of the detection method, functional signals can be input through the signal generating unit to carry out functional testing on the communication chip, and the performance of the communication chip can be comprehensively detected.
Description
technical field [0001] The invention relates to the technical field of electronic chips, in particular to a detection method for a communication chip. Background technique [0002] In recent years, the demand for communication chips has increased significantly, injecting new vitality into the global semiconductor industry. Communication chips are widely used in mobile communications, wireless internet and wireless data transmission industries, and will soon become the largest application market for the global semiconductor chip industry in the early 21st century. [0003] The traditional communication chip test is mainly to repeatedly perform basic read and write operation tests on the communication chip. This method can detect the basic read and write functions of the communication chip, but lacks the detection of the function of the communication chip, and cannot comprehensively test the communication chip performance. Contents of the invention [0004] In order to over...
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IPC IPC(8): H04B17/00
CPCH04B17/00
Inventor 曹佶赵宝忠
Owner 浙江杭可仪器有限公司