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Positive sample expansion method for surface defect detection

A defect detection and positive sample technology, applied in the field of target detection, can solve the problems of exacerbating the imbalance of positive and negative samples in the anchor frame, the incompatibility of defect categories, and the different sizes of defects, so as to improve the convergence speed and classification accuracy , improve the imbalance problem, increase the effect of the number of positive samples

Pending Publication Date: 2021-07-23
SHANGHAI UNIVERSITY OF ELECTRIC POWER
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Problems solved by technology

[0004] When the two-stage target detection algorithm is used for product surface defect detection, due to the unique nature of defects, such as: incompatibility of defect categories, different defect sizes, etc., the number of anchor frames assigned to the target, that is, the number of positive samples, Even less, exacerbating the imbalance between positive and negative samples in the anchor box, reducing the network convergence speed and detection accuracy

Method used

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  • Positive sample expansion method for surface defect detection
  • Positive sample expansion method for surface defect detection
  • Positive sample expansion method for surface defect detection

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Embodiment 1

[0045] refer to Figure 1 to Figure 11 , which is the first embodiment of the present invention, this embodiment provides a positive sample expansion method for surface defect detection, including:

[0046] It should be noted that this embodiment only takes the defect with the label "Residue" as an example, and illustrates the key details of this method by showing the results of each functional unit after running; the size of the sample example is 512*512 pixels, and the sample example shows For example Figure 5 shown.

[0047] S1: Input the position coordinates of the target frame and detection frame generated by the detector into the non-maximum suppression unit, remove overlapping detection frames through the non-maximum suppression unit, and retain the detection frame containing target information.

[0048] What needs to be explained is that the detection frames in each feature layer are sorted in descending order according to the category confidence through the non-max...

Embodiment 2

[0086] In order to verify and explain the technical effect adopted in this method, this embodiment chooses the maximum allocation method and adopts this method to conduct a comparative test, and compares the test results by means of scientific demonstration to verify the real effect of this method.

[0087] The maximum allocation method mainly calculates the IoU by traversing the detection frame and the target frame, filters the detection frame according to the IoU, completes the matching of the detection frame and the target frame, and determines the positive and negative samples; the specific implementation method is: for each detection frame, if it and all If the maximum value of the IoU of the target frame is lower than the negative sample threshold, the detection frame is judged as a negative sample; for each detection frame, if the maximum value of the IoU of it and all target frames is higher than the positive sample threshold, the detection frame The frame is determined...

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Abstract

The invention discloses a positive sample expansion method for surface defect detection, which comprises the following steps: inputting position coordinates of a target frame and a detection frame generated by a detector into a non-maximum suppression unit, removing an overlapped detection frame through the non-maximum suppression unit, and reserving the detection frame containing target information; negative samples, positive samples and semi-positive samples are screened and judged through a sample judgment unit; sampling a negative sample, a positive sample and a semi-positive sample through a sample sampling unit according to a set positive and negative sample sampling proportion; inputting all sampling data into a loss regression unit, performing detection frame classification loss training and detection frame positioning regression training through the loss regression unit, and further expanding positive samples; according to the invention, the overlapping degree between the detection frame and the target frame can be measured more accurately; meanwhile, the imbalance problem of positive and negative samples is improved, the method can be directly migrated and applied to multiple target detection networks, pre-training is not needed, and the universality is good.

Description

technical field [0001] The present invention relates to the technical field of target detection, in particular to a positive sample expansion method for surface defect detection. Background technique [0002] In recent years, object detection technology based on deep neural network has developed rapidly and has been successfully applied in defect detection of many products. The two-stage R-CNN (Region-Convolutional Neural Networks) target detection algorithm is one of the current mainstream target detection methods. In the two-stage detector, the first stage uses a region proposal network (Region Proposal Network, RPN) to screen out several candidate boxes from dense pre-determined bounding boxes (anchor boxes), and then the second stage uses a region of interest subnetwork (RoI -subnet) performs target classification and regression positioning on these candidate boxes. [0003] In the two-stage R-CNN method, when the algorithm is trained, only a few anchor boxes that high...

Claims

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Application Information

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IPC IPC(8): G06K9/62G06T7/00G06T7/62G06N3/04G06N3/08
CPCG06T7/0002G06T7/62G06N3/08G06T2207/10004G06V2201/07G06N3/045G06F18/24G06F18/214Y02P90/30
Inventor 蒋三新王新宇
Owner SHANGHAI UNIVERSITY OF ELECTRIC POWER
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