Positive sample expansion method for surface defect detection
A defect detection and positive sample technology, applied in the field of target detection, can solve the problems of exacerbating the imbalance of positive and negative samples in the anchor frame, the incompatibility of defect categories, and the different sizes of defects, so as to improve the convergence speed and classification accuracy , improve the imbalance problem, increase the effect of the number of positive samples
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Embodiment 1
[0045] refer to Figure 1 to Figure 11 , which is the first embodiment of the present invention, this embodiment provides a positive sample expansion method for surface defect detection, including:
[0046] It should be noted that this embodiment only takes the defect with the label "Residue" as an example, and illustrates the key details of this method by showing the results of each functional unit after running; the size of the sample example is 512*512 pixels, and the sample example shows For example Figure 5 shown.
[0047] S1: Input the position coordinates of the target frame and detection frame generated by the detector into the non-maximum suppression unit, remove overlapping detection frames through the non-maximum suppression unit, and retain the detection frame containing target information.
[0048] What needs to be explained is that the detection frames in each feature layer are sorted in descending order according to the category confidence through the non-max...
Embodiment 2
[0086] In order to verify and explain the technical effect adopted in this method, this embodiment chooses the maximum allocation method and adopts this method to conduct a comparative test, and compares the test results by means of scientific demonstration to verify the real effect of this method.
[0087] The maximum allocation method mainly calculates the IoU by traversing the detection frame and the target frame, filters the detection frame according to the IoU, completes the matching of the detection frame and the target frame, and determines the positive and negative samples; the specific implementation method is: for each detection frame, if it and all If the maximum value of the IoU of the target frame is lower than the negative sample threshold, the detection frame is judged as a negative sample; for each detection frame, if the maximum value of the IoU of it and all target frames is higher than the positive sample threshold, the detection frame The frame is determined...
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