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High-precision detection method and circuit for dynamic response of power supply

A technology of dynamic response and detection method, which is applied in the direction of electronic circuit testing, measuring electronics, measuring devices, etc., can solve the problems of low test efficiency, inability to effectively meet LDO test requirements, and poor reliability, so as to improve efficiency and reliability, and test Process controllable effect

Active Publication Date: 2021-10-29
WUXI ETEK MICROELECTRONICS
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

At present, none of the existing power supplies can effectively meet the test requirements of the dynamic response of the LDO power supply, resulting in problems such as low test efficiency and poor reliability.

Method used

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  • High-precision detection method and circuit for dynamic response of power supply
  • High-precision detection method and circuit for dynamic response of power supply
  • High-precision detection method and circuit for dynamic response of power supply

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Embodiment Construction

[0036] The present invention will be further described below in conjunction with specific drawings and embodiments.

[0037] Such as figure 1 Shown: In order to effectively realize the power supply dynamic response test to LDO, the test process can be improved, and the efficiency and reliability of the test are improved. Connected test power supply circuit; the test power supply circuit includes a first high-precision low-temperature drift power supply 2, a second high-precision low-temperature drift power supply 3 and a high-speed power switch S1, and the first high-precision low-temperature drift power supply 2 passes through the high-speed power switch S1 is adaptively connected to the power supply terminal of the LDO circuit 1 to be tested, the second high-precision low-temperature drift power supply 3 is adaptively connected to the power supply terminal of the LDO circuit 1 to be tested through the one-way switch 4, and the first high-precision low-temperature drift power...

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Abstract

The invention relates to a high-precision detection method and circuit for dynamic response of a power supply. The LDO test circuit comprises an LDO circuit to be tested and a test power supply circuit. The test power supply circuit comprises a first high-precision low-temperature-drift power supply, a second high-precision low-temperature-drift power supply and a high-speed power switch S1; and when the high-speed power switch S1 is controlled to be circularly switched between an on state and an off state, the first test voltage and the second test voltage can be circularly loaded to the power supply end of the to-be-tested LDO circuit, and the power supply dynamic response of the to-be-tested LDO circuit can be determined according to the corresponding working states of the to-be-tested LDO circuit under the first test voltage and the second test voltage. According to the invention, the LDO power supply dynamic response test can be effectively realized, the test process is controllable, and the test efficiency and reliability are improved.

Description

technical field [0001] The invention relates to a test method and circuit, in particular to a high-precision detection method and circuit for dynamic response of a power supply. Background technique [0002] LDO (Linear Voltage Regulator) is currently the most widely used power management circuit in the market, and one of its core parameters is the dynamic response of the power supply. For the dynamic response of the power supply of the LDO, it generally needs to be obtained through testing. In the process of testing the dynamic response of the power supply of the LDO, it is necessary to load the corresponding test voltage on the power supply terminal of the LDO, and the dynamic response of the power supply of the LDO can be measured by using the change of the test voltage. At present, none of the existing power supplies can effectively meet the test requirements of the dynamic response of the LDO power supply, resulting in problems such as low test efficiency and poor reli...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/282
Inventor 汪芳吴鹤松石波史良俊
Owner WUXI ETEK MICROELECTRONICS
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