Defect detection method and defect detection device in industrial quality inspection
A defect detection and quality inspection technology, applied in neural learning methods, image analysis, image enhancement, etc., can solve the problems of inaccurate classification, easy over-inspection, increased computational burden, etc. The effect of improving detection efficiency
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[0043] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0044] figure 1 It is a flowchart of a defect detection method in industrial quality inspection according to an embodiment of the present invention. like figure 1 As shown, the method includes the following steps:
[0045] S1, obtain the data set, and divide the defect of the data set into a training set and a test set after polygon labeling.
[0046] Specifically, the data set can be an image of an industrial site workpiece collected through ...
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