Fault determination method and device, electronic equipment and storage medium
A technology for determining methods and equipment, applied in the fields of instruments, character and pattern recognition, data processing applications, etc., can solve the problems of repeated maintenance, blindness, affecting the data and quality of enterprise products, and achieve the effect of reducing maintenance costs and avoiding excessive maintenance.
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Embodiment 1
[0029] figure 1 It is a schematic flowchart of a first fault determination method provided by the embodiment of the present application, and this embodiment is applicable to the situation of evaluating the probability of a device failure. A fault determination method provided in this embodiment can be executed by the fault determination device provided in the embodiment of the present application, and the device can be implemented by means of software and / or hardware, and integrated into an electronic device that executes the method.
[0030] see figure 1 , the method of this embodiment includes but not limited to the following steps:
[0031] S110. Analyze historical fault data of at least one historical faulty device by a preset clustering algorithm to obtain an analysis result of the historical faulty device; and determine a fault prediction score of the target device according to the analysis result and attribute information of the target device.
[0032] Among them, the...
Embodiment 2
[0045] figure 2 It is a second schematic flowchart of a fault determination method provided in the embodiment of the present application. The embodiment of the present application is optimized on the basis of the above-mentioned embodiments, and the specific optimization is as follows: a detailed explanation of the determination process of the fault prediction score, the load prediction score and the three-phase unbalance degree prediction score is added.
[0046] see figure 2 , the method of this embodiment includes but not limited to the following steps:
[0047] S210. According to the historical fault data of the at least one historical faulty device, determine the operation duration of the at least one historical faulty device; and according to the manufacturer information of the at least one historical faulty device, determine the number of device faults of each manufacturer.
[0048] In the embodiment of the present application, after the electronic device obtains th...
Embodiment 3
[0065] image 3 A schematic structural diagram of a fault determination device provided in an embodiment of the present application, such as image 3 As shown, the device 300 may include:
[0066] The fault score prediction module 310 is configured to analyze the historical fault data of at least one historical faulty device through a preset clustering algorithm to obtain the analysis result of the historical faulty device; and determine the target according to the analysis result and the attribute information of the target device Failure prediction score for devices.
[0067] The load score prediction module 320 is configured to determine the load prediction score of the target device by analyzing the historical fault data of the at least one historical fault device and the historical operation and maintenance data of the target device.
[0068] The unbalance degree prediction module 330 is configured to analyze the historical operation and maintenance data of the target eq...
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