Question bank correction method applied to infant education

A technology of early childhood education and question bank, applied in the field of information education, can solve the problems that children cannot give intuitive evaluation feedback, are not common, the evaluation system is not comprehensive enough, and subjectively reflect the perfection of the education system.

Pending Publication Date: 2022-02-15
成都与众科技有限公司
View PDF0 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] As the object of training, children are often unable to give intuitive evaluation feedback because they are too young. The corresponding evaluation system for early childhood education and institutions is not common in China. Even if there is an evaluation system for educational institutions and teachers, the evaluation system The evaluation system is still not comprehensive enough and subjectively reflects the degree of perfection of the education system

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Question bank correction method applied to infant education
  • Question bank correction method applied to infant education
  • Question bank correction method applied to infant education

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0036] The overall care, overall subjective, overall professional, each dimension of each dimension (body development DA1,), the initial value of this dimension of this dimension is 100, the value range is (0-100),

[0037] I. Time detection of answering questions

[0038] a) Establish each question of each question by historical data

[0039] i. Model parameters include: title object, title, average time, minimum, long, maximum time, answer

[0040]

[0041] II. Model Establishment Steps:

[0042] Traversed every topic

[0043] a) Calculate the average time of the answer and save

[0044] b) Calculate the maximum time and save

[0045] c) Calculate the maximum period of the answer and save

[0046] 2. Furthermore, the maximum time, the maximum time, etc. can be further optimized, and more typical answer time models can be obtained.

[0047] Measurement entry Average time (second) Least time long (second) Maximum time (second) The child's height is growing 4.5 ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to the technical field, and aims to provide a question bank correction method applied to infant education. The method comprises the following steps: S1, enabling a teacher and parents to complete the answering of a test question bank through corresponding ports according to the class of a student, and executing step S2 wherein the test question bank comprises a multi-dimensional evaluation model, ; S2, respectively counting the answer details and the question details of the two parties, and executing step S3, wherein the answer details comprise the answer duration and the answer frequency, the seriousness degree is determined through the answer details, the question details comprise the question number and the question content, the subjective degree is determined through the question details; S3, enabling the multi-dimensional evaluation model to calculate the seriousness degree and subjectivity degree after answering, and matching the corresponding dimensions in combination with the details of the questions; and S4, obtaining scores of different dimensions of the student in the test question bank by calculating the professional degree score of each dimension, correcting the final student score and displaying the evaluation quality by using the subjective degree, and displaying and correcting the test question bank by using the seriousness degree and the professional degree.

Description

Technical field [0001] The present invention relates to the field of information education, and in particular, there is a problem that is applied to a question bank correction method for early childhood education. Background technique [0002] Early child education mainly refers to the education implemented on children aged 3 to 6 years old. Early child education is a pre-school education or the second half of the early education. The front and three-year-old infant education is connected, and the latter and primary education are connected to the important and special stage of human education and development. The narrow children education is Refers to the education of kindergarten and other specialized early childhood education institutions. [0003] Kindergarten Education is a school education system in China. Like school education, kindergarten education also has the advantages of family education and social education, such as planning, systemicity. Kindergarten Education As th...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06Q10/06G06Q50/20
CPCG06Q10/06398G06Q10/06393G06Q50/205
Inventor 刘彬钟成义唐唯端王强王祎蒙陈
Owner 成都与众科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap