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Multi-channel automatic testing device and method for chip

An automated testing and chip technology, applied in the direction of electronic circuit testing, etc., can solve problems such as low efficiency of manual testing, inability to meet mass production and manufacturing, and single debugging methods

Pending Publication Date: 2022-02-22
郑州中科集成电路与系统应用研究院
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, during the factory test process, some factory tests for basic performance and functions are usually carried out through manual inspection. Manual inspection is inefficient, and the debugging method is single, which often cannot meet the needs of mass production.

Method used

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  • Multi-channel automatic testing device and method for chip

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Embodiment Construction

[0040] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the present invention. Apparently, the described embodiment is only a part of the implementation of the present invention, rather than the entire implementation. Based on the embodiment of the present invention, all other embodiments obtained by those skilled in the art without creative work belong to The protection scope of the present invention.

[0041] Such as Figure 1 to Figure 2 As shown, a multi-channel automatic test device for chips includes a main control unit 4, which also includes a power supply module 1, a static detection circuit 7, an antenna open / short circuit detection circuit 12, and a level detection circuit 15, wherein the The static electricity detection circuit 7, the antenna open / short circuit detection circuit 12 and the level detection circuit 15 are all electrically connected wit...

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Abstract

The invention discloses a multi-channel automatic testing device and method for a chip, and the device comprises a main control unit, a power module, an electrostatic detection circuit, an antenna open / short circuit detection circuit, and a level detection circuit, and the electrostatic detection circuit, the antenna open / short circuit detection circuit, and the level detection circuit are all electrically connected with the main control unit. The main control unit, the electrostatic detection circuit, the antenna open / short circuit detection circuit and the level detection circuit are all electrically connected with the power module. The method comprises the steps of initializing the main control unit; carrying out electrostatic detection on the chip; carrying out power-on initialization on the detected chip, and carrying out antenna state detection on the detected chip; and carrying out level detection on the detected chip. The chip is prevented from being electrified and damaged, the production detection efficiency is greatly improved through the automatic detection process, and the factory reject ratio is reduced.

Description

technical field [0001] The invention belongs to the technical field of chip testing, and in particular relates to a multi-channel automatic testing device and method for chips. Background technique [0002] With the development of science and technology and the improvement of automation, many chip manufacturing processes have been automated. However, in the process of factory testing, some factory tests for basic performance and functions are usually carried out through manual inspection. Manual inspection is inefficient, and the debugging method is single, which often cannot meet the needs of mass production. Contents of the invention [0003] In order to solve the above technical problems, the present invention provides a multi-channel automatic testing device and method for chips. [0004] The specific plan is as follows: [0005] A multi-channel automatic test device for chips, including a main control unit, a power supply module, a static detection circuit, an anten...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/28
Inventor 苏武海张筱南李金海李茂盛范理王新玲邱昕冷永清周崟灏赵俊超
Owner 郑州中科集成电路与系统应用研究院
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