Method and system for calculating position parameters of rotating platform for three-dimensional scanning
A technology of rotating platform and scanning system, applied in the field of three-dimensional scanning, can solve the problems of calibration, complicated operation process, inconvenient rotating platform and structured light system, etc., to achieve the effect of efficient registration and simplified operation
Active Publication Date: 2022-06-28
SHENZHEN ANYCUBIC TECH CO LTD
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However, this method requires a specific calibration object to calibrate the relative positional relationship between the rotating platform and the structured light system during the calculation process. Once the relative positional relationship between the rotating platform and the structured light system changes, the calibration object must be re-used to Calibrate the positional relationship, that is, re-use the calibration object to calculate the positional parameters of the rotating platform, which will lead to a more cumbersome operation process, and it is not convenient to calibrate the relative positional relationship between the rotating platform and the structured light system, thus affecting the positional parameters of the rotating platform. Computational efficiency
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[0033] Hereinafter, the present invention will be described in detail with reference to the accompanying drawings and in conjunction with embodiments. It should be noted that the embodiments in the present application and the features of the embodiments may be combined with each other in the case of no conflict.
[0034] At present, once the relative positional relationship between the rotating platform and the structured light system changes, it is necessary to re-use the calibration object to calibrate the positional relationship, that is, to re-use the calibration object to calculate the positional parameters of the rotating platform, which will lead to a cumbersome operation process. It is convenient to calibrate the relative positional relationship between the rotating platform and the structured light system, thereby affecting the calculation efficiency of the rotating platform's position parameters.
[0035] In order to solve the above problem, an embodiment of the pres...
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The invention discloses a method and system for calculating the position parameters of a rotating platform for three-dimensional scanning, mainly aiming at improving the calculation efficiency of the position parameters of the rotating platform, and at the same time facilitating the calibration of the relevant positional relationship between the rotating platform and a structured light system. The method includes: acquiring multiple 3D point clouds of the object to be scanned on the rotating platform; determining an initial source point cloud and a target point cloud from the multiple 3D point clouds acquired, and using the target point cloud As a benchmark, transform the initial source point cloud to obtain a transformed source point cloud; filter out target feature points from the target point cloud according to the transformed source point cloud; based on the target feature The coordinates of the points in the target point cloud and different initial source point clouds are calculated, and the position parameters of the rotating platform relative to the scanning system are calculated.
Description
technical field [0001] The invention relates to the field of three-dimensional scanning, in particular to a method and system for calculating position parameters of a rotating platform for three-dimensional scanning. Background technique [0002] At present, when calculating the position parameters of the rotating platform of the scanner in the field of 3D scanning, the standard sphere or plane calibration plate is usually placed on the rotating platform, and the standard sphere or plane calibration plate is scanned by the structured light system, and the calculation is performed according to the scanning results. Position parameters of the rotating platform relative to the structured light system. However, in this method, the relative positional relationship between the rotating platform and the structured light system needs to be calibrated by a specific calibration object during the calculation process. Once the relative positional relationship between the rotating platfo...
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IPC IPC(8): G06T7/80G06V10/74G06K9/62G01B11/24
Inventor 唐苏明欧阳欣
Owner SHENZHEN ANYCUBIC TECH CO LTD