Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Verification method and device, electronic equipment and storage medium

A verification method and verification environment technology, which are applied in the fields of verification methods and devices, electronic equipment and storage media, can solve the problems of complex verification environment parameters, low verification work efficiency, low management efficiency, etc., and improve readability and management efficiency. , Improve the efficiency of verification work

Pending Publication Date: 2022-05-13
HORIZON ROBOTICS SHANGHAI ARTIFICIAL INTELLIGENCE TECH CO LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] In the field of chip front-end verification, the configurable verification environment is one of the important means to improve the versatility of the verification environment. The verification environment is usually complicated in parameters and difficult to maintain. For this situation, the related technology usually defines the environment component in the environment component class. Parameters, for different verification use cases, the environment needs to be re-modified, resulting in poor readability of parameters and low management efficiency, resulting in low verification work efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Verification method and device, electronic equipment and storage medium
  • Verification method and device, electronic equipment and storage medium
  • Verification method and device, electronic equipment and storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] Hereinafter, exemplary embodiments according to the present disclosure will be described in detail with reference to the accompanying drawings. Apparently, the described embodiments are only some of the embodiments of the present disclosure, rather than all the embodiments of the present disclosure, and it should be understood that the present disclosure is not limited by the exemplary embodiments described here.

[0029] It should be noted that relative arrangements of components and steps, numerical expressions and numerical values ​​set forth in these embodiments do not limit the scope of the present disclosure unless specifically stated otherwise.

[0030] Those skilled in the art can understand that terms such as "first" and "second" in the embodiments of the present disclosure are only used to distinguish different steps, devices or modules, etc. necessary logical sequence.

[0031] It should also be understood that in the embodiments of the present disclosure, "...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The embodiment of the invention discloses a verification method and device, electronic equipment and a storage medium, and the method comprises the steps: obtaining a first verification case; according to the first verification case, a corresponding verification environment is created, the verification environment is provided with a corresponding first parameter configuration tree, and the first parameter configuration tree at least comprises parameter nodes corresponding to all environment components; based on the verification environment and the corresponding first parameter configuration tree, the to-be-tested object is verified, a verification result of the to-be-tested object under the first verification case is obtained, and in the verification process, parameters needed by all the environment components in the verification environment are obtained from parameter nodes corresponding to all the environment components. According to the embodiment of the invention, the parameters of the verification environment are uniformly managed through the parameter configuration tree, and the parameters of the environment components of the verification environment are uniformly obtained from the corresponding parameter nodes, so that the parameters of the environment components are separated from the environment, the parameter readability and management efficiency are effectively improved, and the verification working efficiency is improved.

Description

technical field [0001] The present disclosure relates to chip technology, in particular to a verification method and device, electronic equipment and a storage medium. Background technique [0002] In the field of chip front-end verification, the configurable verification environment is one of the important means to improve the versatility of the verification environment. The verification environment is usually complicated in parameters and difficult to maintain. For this situation, the related technology usually defines the environment component in the environment component class. Parameters, for different verification use cases, need to re-modify the environment, resulting in poor readability of parameters, low management efficiency, resulting in low verification work efficiency. Contents of the invention [0003] In order to solve the above-mentioned technical problems, the present disclosure is proposed. Embodiments of the present disclosure provide a verification met...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06F30/33
CPCG06F11/3688G06F11/3692G06F30/33
Inventor 李正玉蒋伟伟胡旭
Owner HORIZON ROBOTICS SHANGHAI ARTIFICIAL INTELLIGENCE TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products