Electronic component test device

Abstract

An electronic component test apparatus for performing a test by pressing the input / output terminals of tested electronic components against the contact parts of a test head part by a moving means with the tested electronic components mounted on electronic component feeding media, wherein two sheets of electronic component feeding media having the tested electronic components mounted thereon are held by one moving means and, at the same time, two sheets of electronic component feeding media having the tested electronic components mounted thereon are held by the other moving means, and each moving means carries in and out the electronic component feeding media independently to the contact groups.

Description

technical field [0001] The present invention relates to an electronic testing device for testing electronic components, and relates to an electronic component testing device capable of performing tests with high test efficiency by having a plurality of moving mechanisms that simultaneously hold and test a plurality of electronic component transport media carrying electronic components to be tested device. Background technique [0002] In an electronic component testing device called a handling device, a plurality of electronic components accommodated on trays are transported into the testing device, each electronic component is brought into electrical contact with a test head, and the electronic component testing device body (hereinafter also referred to as the tester) device) for testing. When the test is completed, each electronic component is sent out from the test head, and is switched to the tray corresponding to the test result, thereby classifying qualified products ...

AI Technical Summary

Problems solved by technology

[0012] In addition, it is also conceivable, for example, to divide the 32 contact parts 110a into several contact groups 110, and to set an independent moving mechanism in each contact group 110, so that the electronic component conveying medium 10 with as few sheets as possible can always ensure simultaneous movement. Measure the number, but if the contact group exceeds a certain level, it may become a cause of equipment cost increase

[0013] In addition, it is also conceivable, for example, to divide the 32 contact portions 110a into several contact groups 110, use one moving mechanism to move all the electronic component conveying media 10 together, and install a moving mechanism for testing, thereby ensuring the number of simultaneous measurements at all times. , but since many pieces of electronic component conveying medium 10 are held together, then along with the increase of the number of electronic component conveying medium 10, it will be difficult to ensure the positioning accuracy of each electronic component 20 and contact portion 110a.

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