Semiconductor circuit, semiconductor device, and method for testing same semiconductor circuit
An inspection method and semiconductor technology, which can be applied to semiconductor devices, circuits, measuring devices, etc., and can solve problems such as the effect of reducing the device and the complexity of the circuit.
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Embodiment approach 1
[0029] if according to figure 1 One embodiment of the present invention will be described as follows up to FIG. 3 .
[0030] figure 1 It is a figure which shows one embodiment of this invention, and shows the circuit structure of the semiconductor detection circuit (semiconductor circuit) 10.
[0031] The semiconductor detection circuit 10 includes: a detection terminal TEST, a first resistance element R1, a second resistance element R2, a first diode (first switch part) D1, a second diode (second switch part) D2, a first Fixed potential point 11 , second fixed potential point 12 and connection point 13 . The semiconductor detection circuit 10 is installed in a semiconductor device, and measures the respective resistance values of a resistor designed to have the same resistance value as the first resistor element R1 used in the semiconductor device and a resistor designed to have the same resistance value as the second resistor element R2. What kind of resistance value ...
Embodiment approach 2
[0074] according to Figure 4 Another embodiment of the present invention will be described as follows.
[0075] This embodiment is an application example of the first embodiment. This embodiment and figure 1 ~Compared with the semiconductor detection circuit shown in FIG. 3, the structures of the first switch part and the second switch part are different, and the other structures are the same. In addition, the same code|symbol is attached|subjected to the structure and the structure which has the same function as what was demonstrated in the said embodiment, and the description is abbreviate|omitted.
[0076] Figure 4 This is an application example of Embodiment 1. Figure 4 is to indicate that there is a reduction figure 1 A circuit diagram of the semiconductor detection circuit 40 showing the structure of power consumption in the semiconductor detection circuit 10 shown.
[0077] Such as Figure 4 As shown, the semiconductor detection circuit 40 in the second embo...
Embodiment approach 3
[0087] according to Figure 5 - Fig. 7 When describing another embodiment of the present invention, it will be as follows.
[0088] Figure 5 One embodiment of the present invention is shown, and the circuit configuration of the semiconductor detection circuit 50 is shown.
[0089] The semiconductor detection circuit 50 includes: a detection terminal TEST, a first resistance element R1, a second resistance element R2, a resistance element Ra and a resistance element Rb for voltage division, a first transistor (first switch portion) Q1, a second transistor ( second switch part) Q2 , a first fixed potential point 51 , a second fixed potential point 52 , a connection point 53 and a connection point 56 .
[0090] This semiconductor detection circuit 50 is mounted in a semiconductor device. The semiconductor detection circuit 50 is manufactured to measure the respective resistance values of the resistors having the same resistance value as the design of the first resistance elem...
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