Method and apparatus for operating a string of charge trapping memory cells
A technology of memory unit and charge storage, which is applied in static memory, read-only memory, digital memory information, etc., and can solve serious problems such as the limitation of PHINES structure expansion
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[0050] Figure 1 shows an array of NAND strings having non-volatile charge-trapping memory cells having at most one single charge storage state programmed with holes. The array shown includes four strings, or columns, of charge-trapping memory cells, each column having a first terminal and a second terminal, the first terminal terminating in a first row select transistor SLG1 with a gate bias of 8 volts. 130, the second terminal is terminated by the second row select transistor SLG2 132 whose gate bias is 8 volts. The contents of the array are accessed through bit lines BL1 140 biased at 0 volts, BL2 142 biased at 5 volts, BL3 144 biased at 5 volts, and BL4 146 biased at 0 volts, each bit line The first terminals of the charge-trapping memory cells of the corresponding columns are connected, and the second terminals of the charge-trapping memory cells of these columns are connected to the voltage source 150 biased at 0 volts. These four columns of charge trapping memory cells ...
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