Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

N-Path Interleaving Analog-to-Digital Converter (ADC) with Offset gain and Timing Mismatch Calibration

Active Publication Date: 2016-02-18
IQ ANALOG
View PDF0 Cites 17 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The patent describes a method for reducing timing errors in a system that uses multiple analog-to-digital converters (ADCs). The method involves creating a delayed signal by interleaving the ADC signal and then using it to multiply the rotated signal. This results in a timing error signal that can be used to accumulate timing errors in each of the ADC signal paths. By applying corrections to minimize these errors, the system can achieve better accuracy and reliability.

Problems solved by technology

As a result these timing and gain errors produce artifacts which in frequency domain show up as spectral images of the desired signal centered around every multiple of fs / n, where fs is the sampling rate of the composite ADC.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • N-Path Interleaving Analog-to-Digital Converter (ADC) with Offset gain and Timing Mismatch Calibration
  • N-Path Interleaving Analog-to-Digital Converter (ADC) with Offset gain and Timing Mismatch Calibration
  • N-Path Interleaving Analog-to-Digital Converter (ADC) with Offset gain and Timing Mismatch Calibration

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032]FIG. 1 is a schematic block diagram of an n-path time interleaved analog-to-digital converter (ADC) with a system for calibrating timing mismatch. The ADC 100 comprises at least n ADCs 102-1 through 102-n. Each ADC has an input on line 104 to accept the analog input, and input on lines 105-1 through 105-n to accept clock signals, and an output path, respectively 106-1 through 106-n, to supply a. digital sample signal, where n is an integer greater than 1. An interleaver 108 has inputs to accept the digital sample signals on lines 106-1 through 106-n, and an output on line 110 to supply a digital n-path interleaved ADC signal. Since this path occurs after error correction, it may also be known as a corrected digital output. A clock 112 is also shown to provide n number of different phases of the sampling clock fs to the ADCs 102-1 through 102-n. The ADC 100 further comprises a gain and timing error estimation block 114. Offset estimation block 120 accepts the interleaved ADC si...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A system and method are provided for calibrating timing mismatch in an n-path time interleaved analog-to-digital converter (ADC). The method digitizes an analog signal with an n-path interleaved ADC, creating an interleaved ADC signal. In a first process, the phase of the interleaved ADC signal is rotated by 90 degrees, creating a rotated signal. This rotation may be accomplished using a finite impulse response (FIR) filter with taps at {0.5, 0, −0.5}, enabled as a derivative filter, or as a Hilbert transformation. In a parallel second process, the interleaved ADC signal is delayed, creating a delayed signal. The rotated signal is multiplied by the delayed signal to create a timing error signal. Using the timing error signal, timing errors are accumulated for the ADC signal paths, and corrections are applied that minimize timing errors in each of the n ADC signal paths.

Description

RELATED APPLICATIONS[0001]The following applications are incorporated herein by reference:[0002]CURRENT IMPULSE (CI) DIGITAL-TO-ANALOG CONVERTER (DAC), invented by Mikko Waltari, Ser. No. 141750,203, filed Jun. 25, 2015, filed Jun. 25, 2015, issued as U.S. Pat. No. 9,178,528[0003]TRAVELING PULSE WAVE QUANTIZER, invented by Mikko Waltari, Ser. No. 14 / 681,206, filed Apr. 8, 2015; issued as U.S. Pat. No. 9,098,072;[0004]N-PATH INTERLEAVING ANALOG-TO-DIGITAL CONVERTER (ADC) WITH BACKGROUND CALIBRATION, invented by Mikko Waltari, Ser. No. 14 / 531,371, filed Nov. 3, 2014, now U.S. Pat. No. 9.030,340;[0005]INTERLEAVING ANALOG-TO-DIGITAL CONVERTER (ADC) WITH BACKGROUND CALIBRATION, invented by Mikko Waltari et al., Ser. No. 14 / 511,206, filed Oct. 10, 2014, now U.S. Pat. No. 8,917,125;[0006]SYSTEM AND METHOD FOR FREQUENCY MULTIPLIER JITTER CORRECTION, invented by Mikko Waltari et al., Ser. No. 14 / 081,568, filed Nov. 15, 2013, now U.S. Pat. No. 8,878,577;[0007]TIME-INTERLEAVED ANALOG-TO-DIGITA...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(United States)
IPC IPC(8): H03M1/10H03M1/12
CPCH03M1/1023H03M1/121H03M1/1245H03M1/0626H03M1/0836H03M1/1052H03M1/1215
Inventor WALTARI, MIKKO
Owner IQ ANALOG
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products