Pattern classification based proximity corrections for reticle fabrication
a proximity correction and pattern technology, applied in the field of patent classification based proximity corrections for reticle fabrication, can solve the problems that conventional circuit design and reticle fabrication techniques do not adequately provide compensation, and achieve the effect of facilitating the correction of proximity effects
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[0022]As described above, a circuit design after tapeout exists in a digital layout that a mask house uses to manufacture reticle(s) (the term reticle as used herein is understood to encompass ‘mask’ and ‘photomask’ as understood in the art). An example of this manufacturing process, referred to herein as a reticle process, reticle process flow, or reticle-formation process, is depicted and described with reference to FIG. 1.
[0023]The process begins after a Graphic Data System output, GDSout (102) referring to the graphic database system output file / format of the digital layout for the subject circuit design. Various constant global bias adjustments are then determined / performed either separately, or, as depicted here, as part of a single process (104), to adjust for etch or other biases introduced during the reticle formation process. Example bias adjustments include coarse adjustments (ones that are generally applied indiscriminately to all features within a layout or potion there...
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